研究目的
Investigating the angle-dependent sensitivity of rotationally symmetric thick pinholes used for gamma imaging.
研究成果
The experimental results are in accord with the simulation data, indicating the potential of the measurement method proposed here. This knowledge paves the way for the final evaluation of the imaging system’s performance and image reconstruction in the gamma imaging in ICF.
研究不足
The study is limited by the image intensity uncertainty of the image recording system and the angle uncertainty of the thick pinhole.
1：Experimental Design and Method Selection:
The study employed a geometric algorithm and Monte Carlo numerical simulations to analyze the angle-dependent sensitivity of thick pinholes with different structural parameters.
2：Sample Selection and Data Sources:
A small quasi-point source was established based on a 10K curie level 60Co gamma ray source for experimental measurements.
3：List of Experimental Equipment and Materials:
The thick pinhole was made of tungsten (W), and a scintillator (Ce:YAG) was used to convert gamma-radiation to visible light.
4：Experimental Procedures and Operational Workflow:
The image position remained unchanged by rotating the thick pinhole around its center, avoiding image distortion.
5：Data Analysis Methods:
The image intensity was recorded by a gated intensified CCD camera, and the angle-dependent sensitivity was calculated by normalizing the CCD count with the source at different radial positions to the count with the source at the central axis position.
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