研究目的
Investigating the effect of the anisotropy of etching surface morphology on light-trapping and photovoltaic conversion efficiencies of silicon solar cell.
研究成果
The study concludes that the anisotropy of saw marks significantly affects the photovoltaic conversion efficiency of silicon solar cells, with higher efficiency observed when the thin grid line of Ag electrode is parallel to the saw marks. The texturization process with specific additives can achieve a low reflectivity of 20%, enhancing light-trapping efficiency.
研究不足
The study focuses on the effect of specific additives and etching conditions on the texturization process and photovoltaic conversion efficiency, potentially limiting its applicability to other texturization methods or materials.
1：Experimental Design and Method Selection:
The study involved texturizing multicrystalline silicon wafers using a wet-chemical etching process with specific additives to analyze the effect on surface morphology and photovoltaic conversion efficiency.
2：Sample Selection and Data Sources:
DWS mc-Si wafers were used, cut into specific sizes and treated with an acid mixture solution.
3：List of Experimental Equipment and Materials:
SEM for surface morphology observation, 3D laser confocal microscope for surface topography, Perkin–Elmer Lambda 750 UV/vis/NIR spectrometer for reflection measurements.
4：Experimental Procedures and Operational Workflow:
Wafers were textured in acid mixtures, followed by hydrophobic treatment, n-type emitter diffusion, anti-reflection coating application, and metallization.
5：Data Analysis Methods:
The study analyzed the morphology, reflectivity, and photovoltaic conversion efficiency of the textured wafers.
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