研究目的
Investigating the possibility of further raising the spatial resolution of position sensitive detectors (PSDs) by developing a new type of PSD based on the Multiscan principle.
研究成果
The PSD Multiscan's operation principle, based on measuring the median position of the optical signal with respect to a moving I-V characteristic, offers significant advantages over traditional lateral PSDs. The device achieves a high resolution (as good as 0.05 μm) that is independent of the optical spot's position within the sensing area and can be preserved for sensors of different lengths by adjusting the applied voltage. The introduction of a nonlinear amplifier element further enhances the device's resolution.
研究不足
The actual noise in the experimental setup was found to exceed the calculated noise, limiting the resolution of the detector. The resolution is also dependent on the power of the illuminating light and the sensitivity of the measuring equipment.
1:Experimental Design and Method Selection:
The study involves the development and testing of a PSD Multiscan, which operates on a principle fundamentally different from lateral PSDs. The methodology includes the analysis of the current-voltage (I-V) characteristic of the sensor to determine the optical signal's median position.
2:Sample Selection and Data Sources:
Custom-made Multiscan PSDs of different lengths (6, 10, and 20 mm) were used. The optical signal was created by a light-emitting diode and an optical slit.
3:List of Experimental Equipment and Materials:
The equipment includes a pulse generator, light-emitting diode HPL-44 (λ = 660 nm), optical slit, nano-positioner, and a 6-digit multimeter for recording output data.
4:Experimental Procedures and Operational Workflow:
The experiment involved modulating the optical signal, measuring the output voltage corresponding to the optical signal's median position, and analyzing the resolution of the PSD Multiscan under different conditions.
5:Data Analysis Methods:
The resolution was calculated based on the output voltage RMS noise, and the results were analyzed to determine the device's performance.
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