研究目的
To investigate the growth and characterization of Cs2LiLaCl6:Ce (CLLC) single crystals for dual gamma/neutron detection.
研究成果
Transparent, single-phase CLLC crystals were successfully grown from a LiCl-rich melt using the vertical Bridgman method. The crystals exhibited promising scintillation properties for gamma and neutron detection, with a light output of about 28000 ph/Mev and an energy resolution of 7.1% at 662 keV.
研究不足
The study was limited by the difficulty in growing large, transparent CLLC crystals and the presence of secondary phases in crystals grown from stoichiometric melts.
1：Experimental Design and Method Selection:
The vertical Bridgman technique was used with a LiCl-rich melt and high axial temperature gradient to grow transparent CLLC crystals.
2：Sample Selection and Data Sources:
Polycrystalline materials were prepared by melting raw materials in quartz ampoules.
3：List of Experimental Equipment and Materials:
Anhydrous CsCl (3N), LiCl (3N), LaCl3 (4N), and CeCl3 (4N) were used.
4：Experimental Procedures and Operational Workflow:
The growth was conducted in two steps with different temperature gradients and pull rates.
5：Data Analysis Methods:
Powder X-ray diffraction (PXRD), differential scanning calorimetry (DSC), optical transmission spectrum, photoluminescence excitation and emission spectra, and X-ray induced luminescence (XIL) spectrum were analyzed.
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HORIBA FL3-111 fluorescence spectrometer
FL3-111
HORIBA
Photoluminescence decay curves measurement
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Hamamatsu CR105-2 PMT
CR105-2
Hamamatsu
Pulse height spectrum recording
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Tektronix DPO5104 oscilloscope
DPO5104
Tektronix
Scintillation decay curve evaluation
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Bruker D8 Focus X-ray diffractometer
D8 Focus
Bruker
PXRD analysis
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Shimadzu UV-2501PC
UV-2501PC
Shimadzu
Optical transmission spectrum measurement
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HITACHI F-4600 spectrophotometer
F-4600
HITACHI
Photoluminescence excitation and emission spectra measurement
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CsCl
3N
Beijing Grinm Advanced Materials Co. Ltd.
Raw material for crystal growth
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LiCl
3N
Beijing Grinm Advanced Materials Co. Ltd.
Raw material for crystal growth
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LaCl3
4N
Beijing Grinm Advanced Materials Co. Ltd.
Raw material for crystal growth
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CeCl3
4N
Beijing Grinm Advanced Materials Co. Ltd.
Raw material for crystal growth
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NETZSCH STA 449C
STA 449C
NETZSCH
DSC and TGA analysis
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ORTEC 113
113
ORTEC
Preamplifier
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ORTEC 671
671
ORTEC
Shaping amplifier
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ORTEC 926
926
ORTEC
Multichannel analyzer
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