研究目的
Investigating the carrier generation mechanisms in p-type and n-type SnNb2O6 foordite by controlling annealing conditions.
研究成果
The study successfully controlled the conductivity of SnNb2O6 foordite, demonstrating higher hole mobility than Sn2Nb2O7. SnNb?? was identified as the dominant defect for hole carrier generation, while VO1/O2′ were the sources of electron carriers. Optimal annealing conditions are crucial for controlling carrier type and density.
研究不足
The study focuses on bulk samples; thin film preparation and characterization could provide additional insights. The absolute occupancy of light elements like oxygen is difficult to determine accurately by XRD.
1:Experimental Design and Method Selection:
Prepared SnNb2O6 foordite samples by a solid-state reaction, controlling annealing conditions to achieve p-type and n-type conductivities.
2:Sample Selection and Data Sources:
Used SnO and Nb2O5 as starting materials, annealed under N2 atmosphere at different temperatures.
3:List of Experimental Equipment and Materials:
XRD patterns obtained using PANalytical X’Pert Pro MPD; diffuse reflectance spectra measured using Shimadzu UV-2550 with ISR-2200 integrating sphere; chemical composition determined using Rigaku ZSX XRF spectrometer; electrical properties estimated using Toyo Resitest 8310 and ADVANCE RIKO ZEM-
4:Experimental Procedures and Operational Workflow:
Mixed starting materials, calcined, ground, pressed into discs, annealed under N2, and characterized.
5:Data Analysis Methods:
Rietveld analysis of XRD patterns using RIETAN-FP; absorption spectra converted using Kubelka-Munk method; defect contents estimated from 119Sn M?ssbauer and XRF measurements.
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