研究目的
To assess the suitability of cobalt germanides as potential methane steam reforming catalysts by studying their oxidation behavior under low pressures of O2 and H2O.
研究成果
The study describes key characteristics of the bulk and surface properties of CoGe films that relate to their suitability as methane reforming catalysts. There is some risk that the CoGe may lose Ge over time if the catalyst is subjected to high temperature oxidative conditions, but if the reaction conditions are maintained such that the catalyst surface is reduced from the as-deposited state, then the catalyst will likely be stable.
研究不足
The study is limited to the oxidation behavior of CoGe films under low pressures of O2 and H2O. The potential for GeO desorption under reaction conditions may be a concern for the stability of CoGe catalysts.
1:Experimental Design and Method Selection:
The study involved sputter deposition of CoGe alloy films and their characterization after post-deposition annealing in high vacuum up to 1000 °C. X-ray photoelectron spectroscopy (XPS) was used to study the initial oxidation of amorphous and crystalline CoGe alloy surfaces under low pressures of O2 and H2O.
2:2O.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Cobalt germanide thin films were deposited via RF magnetron sputtering using a CoGe sputter target. A silicon (100) wafer with a 100 nm thermal oxide was used as a substrate.
3:List of Experimental Equipment and Materials:
AJA sputter system, Zemetrics ZeScope optical profilometer, Veeco di-Innova atomic force microscope (AFM), Rigaku IV Multipurpose diffractometer, Perkin-Elmer Phi 5600 MultiTechnique system for XPS.
4:Experimental Procedures and Operational Workflow:
The films were annealed in a Hiden temperature programmed desorption (TPD) workstation. The sample temperature was measured with a thermocouple. XPS was performed to study the oxidation of the films.
5:Data Analysis Methods:
XPS spectra were fitted using CASA XPS software with Shirley backgrounds. XRD data was analyzed to determine the crystallographic structure of the films.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容