研究目的
Investigating the thermal stability of SS/Mo/Al2O3 spectrally selective solar absorber coatings in air and vacuum at different temperatures.
研究成果
The SS/Mo/Al2O3 spectrally selective coatings exhibit good thermal stability in air up to 350°C and in vacuum up to 600°C, making them promising materials for CSP applications.
研究不足
The coatings are stable in air up to 350°C and in vacuum up to 600°C. Degradation occurs at higher temperatures due to oxidation of Mo and diffusion of Fe, C, and formation of Fe2MoC.
1：Experimental Design and Method Selection:
The Mo/Al2O3 coatings were deposited on stainless steel (SS) substrates by magnetron sputtering system. High purity Mo (99.99%) and Al2O3 (99.99%) targets were used for the deposition of the coatings.
2：99%) and Al2O3 (99%) targets were used for the deposition of the coatings. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: The SS/Mo/Al2O3 solar absorber coatings were heat treated in air and vacuum in a tubular furnace at temperatures in the range of 300–400°C and 400–700°C, respectively.
3：List of Experimental Equipment and Materials:
Ultra-high resolution scanning electron microscope (SU8200), X-ray diffractometer (Rigaku D/max 2400/PC), atomic force microscopy (Dimension Icon, Bruker), micro-Raman spectroscopy (JOBIN-YVON-SPEX), Perkin Elmer Lambda 950 UV/Vis/NIR spectrometer, Bruker TENSOR 27 FT-IR Spectrometer.
4：Experimental Procedures and Operational Workflow:
The coatings were annealed at different temperatures in air and vacuum for 2 h. The surface morphology, microstructure, composition distribution, diffusion and optical properties before and after high-temperature annealing were characterized.
5：Data Analysis Methods:
The optical properties were analyzed using UV–vis spectrophotometer and emissometer. The microstructure and composition were analyzed using SEM, AFM, XRD, and micro-Raman spectroscopy.
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Atomic force microscopy
Dimension Icon
Bruker
Surface imaging
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UV/Vis/NIR spectrometer
Perkin Elmer Lambda 950
Perkin Elmer
Measuring reflectance spectra in the wavelength interval 0.3–2.5 μm
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FT-IR Spectrometer
Bruker TENSOR 27
Bruker
Obtaining reflectance spectra in the wavelength interval 2.5–20 μm
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Ultra-high resolution scanning electron microscope
SU8200
Tokyo, Japan
Observing surface morphologies
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X-ray diffractometer
Rigaku D/max 2400/PC
Rigaku Corporation, Tokyo, Japan
Recording X-ray diffraction (XRD) patterns
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Micro-Raman spectroscopy
JOBIN-YVON-SPEX
Measuring changes in the chemical state of the surface
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