研究目的
To investigate the effect of magnesium substitution on the structural, morphological, optical and wettability properties of cobalt ferrite thin films.
研究成果
Magnesium substitution in cobalt ferrite thin films modifies their structural, morphological, optical, and wettability properties. The films exhibit nanocrystalline nature, decreased band gap with magnesium content, and hydrophilic surface properties.
研究不足
The study does not discuss the magnetic properties of the films, which could be significant for applications in magneto-optic recording and spintronics. The effect of film thickness on properties beyond optical band gap is not explored.
1:Experimental Design and Method Selection
The study employed the spray pyrolysis technique for depositing magnesium substituted cobalt ferrite thin films on glass substrates. The films were annealed at 500°C for 4 hours to enhance crystallinity and remove secondary phases.
2:Sample Selection and Data Sources
AR grade nitrates of magnesium, cobalt, and ferric were used as precursors. The films were characterized using XRD, Raman spectroscopy, SEM, TEM, UV-VIS spectrophotometry, PL, and contact angle measurements.
3:List of Experimental Equipment and Materials
X-ray diffractometer (Bruker D8 advance), Raman spectrophotometer, scanning and transmission electron microscope, UV-VIS spectrometer (Perkin Elmer Lambda 950), surface profiler (AMBIOS, USA XP-I), Fluoromax-4CP-0975D-1512-FM for PL, and contact angle meter.
4:Experimental Procedures and Operational Workflow
The films were deposited using spray pyrolysis with optimized parameters, annealed, and then characterized for structural, morphological, optical, and wettability properties.
5:Data Analysis Methods
XRD data was analyzed for crystallite size and lattice constant using specific relations. Raman spectra were analyzed for vibrational modes. SEM and TEM images were used for morphological analysis. UV-VIS data was used to calculate band gap. PL spectra were analyzed for emission characteristics. Contact angle measurements were used to assess wettability.
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X-ray diffractometer
Bruker D8 advance
Bruker
Structural characterization of thin films
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UV-VIS spectrometer
Perkin Elmer Lambda 950
Perkin Elmer
Optical absorption measurement
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Raman spectrophotometer
Vibrational energy states and structural information analysis
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Scanning electron microscope
Surface morphology study
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Transmission electron microscope
Particle size and morphology analysis
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Surface profiler
AMBIOS, USA XP-I
AMBIOS
Film thickness measurement
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Fluoromax-4CP-0975D-1512-FM
Photoluminescence property measurement
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Contact angle meter
Wettability testing
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