摘要： The DIALS diffraction-modeling software package has been applied to serial crystallography data. Diffraction modeling is an exercise in determining the experimental parameters, such as incident beam wavelength, crystal unit cell and orientation, and detector geometry, that are most consistent with the observed positions of Bragg spots. These parameters can be re?ned by nonlinear least-squares ?tting. In previous work, it has been challenging to re?ne both the positions of the sensors (metrology) on multipanel imaging detectors such as the CSPAD and the orientations of all of the crystals studied. Since the optimal models for metrology and crystal orientation are interdependent, alternate cycles of panel re?nement and crystal re?nement have been required. To simplify the process, a sparse linear algebra technique for solving the normal equations was implemented, allowing the detector panels to be re?ned simultaneously against the diffraction from thousands of crystals with excellent computational performance. Separately, it is shown how to re?ne the metrology of a second CSPAD detector, positioned at a distance of 2.5 m from the crystal, used for recording low-angle re?ections. With the ability to jointly re?ne the detector position against the ensemble of all crystals used for structure determination, it is shown that ensemble re?nement greatly reduces the apparent nonisomorphism that is often observed in the unit-cell distributions from still-shot serial crystallography. In addition, it is shown that batching the images by timestamp and re-re?ning the detector position can realistically model small, time-dependent variations in detector position relative to the sample, and thereby improve the integrated structure-factor intensity signal and heavy-atom anomalous peak heights.