研究目的
Investigating the temperature-dependent swelling behavior of vapor-deposited smart polymer thin films, focusing on the effects of cross-linking and film thickness on the lower critical solution temperature (LCST).
研究成果
The LCST of pNIPAAm-based thin films is influenced by both cross-linking degree and film thickness, with density variations in the polymeric matrix playing a key role. The findings highlight the importance of deposition conditions and material properties in designing smart polymeric structures for applications.
研究不足
The study is limited to poly(N-isopropylacrylamide) thin films with specific cross-linkers and thickness ranges. Long-term kinetic effects and substrate-polymer interface influences require further investigation.
1：Experimental Design and Method Selection:
The study utilized initiated chemical vapor deposition (iCVD) for polymer thin film fabrication, with spectroscopic ellipsometry (SE) and X-ray reflectivity (XRR) for characterization.
2：Sample Selection and Data Sources:
Single-sided polished silicon wafers with a native oxide layer were used as substrates.
3：List of Experimental Equipment and Materials:
Custom-built iCVD reactor, spectroscopic ellipsometer (M-2000S, J.A. Woollam, USA), X-ray reflectometer (PANalytical Empyrean diffractometer), FTIR spectrometer (Bruker IFS 66 v/s).
4：Experimental Procedures and Operational Workflow:
Films were deposited at varying thicknesses and cross-linking degrees, followed by SE and XRR measurements to assess swelling behavior and density.
5：Data Analysis Methods:
Optical models for SE data evaluation, critical angle analysis for XRR data to determine film density.
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