研究目的
Investigating the effects of terbium oxide on phase transition and electronic properties of potassium-sodium niobate-based ceramics to improve their temperature stability.
研究成果
Tb4O7 induces a phase transition from tetragonal-orthorhombic coexistence phases to pseudo-cubic phase, reduces grain size, and enhances the temperature stability of KNNS-BNKZ ceramics. The doped ceramics show promise for lead-free piezoelectric applications in a wide temperature range.
研究不足
The study focuses on the effects of Tb4O7 doping on KNNS-BNKZ ceramics, but does not explore the effects of other dopants or preparation methods. The temperature stability is improved, but the piezoelectric properties are reduced with Tb4O7 doping.
1：Experimental Design and Method Selection:
The study used solid state reaction method to prepare KNNS-BNKZ-xTb4O7 ceramics. The effects of Tb4O7 on phase transition, grain growth, and electronic properties were studied.
2：Sample Selection and Data Sources:
Raw materials included K2CO3, Na2CO3, Nb2O5, Sb2O3, Bi2O3, ZrO2, and Tb4O
3：List of Experimental Equipment and Materials:
Equipment included X-ray diffraction (XRD), field-emission scanning electron microscope (FE-SEM), micro Raman spectrometer, and atomic force microscopy.
4：Experimental Procedures and Operational Workflow:
The mixed powders were ball-milled, calcined, compacted into wafers, sintered, and then analyzed for crystal structures, microscopic appearances, and electrical properties.
5：Data Analysis Methods:
The study analyzed XRD patterns, SEM images, Raman spectra, and impedance spectroscopies to understand the effects of Tb4O7 doping.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
Field-emission scanning electron microscope
S-4700
Hitachi Ltd.
Observing the microscopic appearances and element mapping image of the samples
-
Atomic force microscopy
Cypher ES
OXFORD Instruments
Carrying out piezoelectric force microscopes (PFM)
-
Precision impedance analyser
Agilen 4294 A
Agilent Inc.
Measuring the temperature dependences of dielectric performance and planar electromechanical coef?cient
-
X-ray diffraction
D8 Advance
Bruker Inc.
Studying the crystal structures of samples
-
Micro Raman spectrometer
Horiba Jobin Yvon Inc.
Studying Raman scattering experiments
-
Broad frequency dielectric spectrometer
Concept80
Novocontrol Inc.
Measuring the impedance spectroscopies
-
Ferroelectric test unit
TF2000FE-HV
aix-ACCT Inc.
Measuring the bipolar small signal piezoelectric coef?cient d33* hysteresis curves
-
登录查看剩余5件设备及参数对照表
查看全部
