研究目的
To present a new measurement technique for quantifying noise temperature based on temperature and time, improving efficiency and dynamic range over conventional methods.
研究成果
The new instrumentation concept for thermal-noise metrology, traceable to temperature and time, improves measurement efficiency and dynamic range. It allows cancellation of added noise from solid-state switches and enables precision noise-temperature measurements, representing a significant advancement in microwave thermal-noise metrology.
研究不足
The technique requires precise synchronization of switches and correction for mismatch and loss, which may introduce complexity. The dependency of added noise on variables like supply voltage and switching frequency may also pose challenges.
1：Experimental Design and Method Selection:
The technique uses a single-pole, double-throw (SPDT) ultra-fast switch to combine signals from two synchronized electromechanical (EM) switches, adjusting the combined noise signal magnitude via the duty cycle of a TTL pulse.
2：Sample Selection and Data Sources:
Input ports of EM switches are terminated by an unknown noise source, a known cold noise source, and two known ambient noise references.
3：List of Experimental Equipment and Materials:
Includes SPDT ultra-fast switch, EM switches, TTL pulse generator, and standard radiometer backend components like isolators, down converters, filters, amplifiers, and a detector.
4：Experimental Procedures and Operational Workflow:
The duty cycle of the TTL pulse is adjusted to minimize the difference between the combined noise signal and the ambient noise reference, achieving a balanced mode.
5：Data Analysis Methods:
The noise temperature is inferred from the duty cycle adjustments, with corrections for mismatch and loss based on S-parameter measurements.
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