研究目的
Exploring the suitability and future potential of CMOS-compatible Single Photon Avalanche Diodes (SPADs) for display metrology applications.
研究成果
CMOS SPAD technology can already make a significant contribution to display metrology, with substantial potential for growth through generic improvements and custom design of products optimized for display metrology requirements.
研究不足
The study highlights the potential of CMOS SPADs but also notes the need for further optimization and custom design to fully meet the specific requirements of display metrology.
1：Experimental Design and Method Selection:
The study focuses on the application of CMOS SPAD technology for display metrology, comparing its performance with existing technologies.
2：Sample Selection and Data Sources:
Utilizes a CMOS-SPAD device (FlashTDC) and a binary QVGA SPAD camera (SPCImager) for measurements.
3：List of Experimental Equipment and Materials:
Includes FlashTDC chip, SPCImager, and comparison with Hamamatsu H10722-110 PMT.
4：Experimental Procedures and Operational Workflow:
Demonstrates the use of CMOS SPAD devices for single-point sensing and imaging for electronic display characterization.
5：Data Analysis Methods:
Analyzes photon counts and compares specifications between dSiPM and PMT.
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