研究目的
To present a complementary technique for the measurement of dielectric multilayer structures with thicknesses of submillimeter to several centimeters using frequency-modulated continuous-wave electronic transceivers and model-based signal processing techniques.
研究成果
The all-electronic measurement setup enables the inspection of multilayer structures such as PVC-pipes with integrated foam layers. Layers thinner than the inherent resolution limit can be resolved. Future developments will address systems with higher operation frequencies and modulation bandwidths, as well as improvements of the signal model.
研究不足
The inaccuracy of the thickness specification can cause an error propagation. More accurate results require alternative methods to determine the refractive index. The correlation intervals are limited to restrict the calculation complexity.
1：Experimental Design and Method Selection:
The study employs a frequency-modulated continuous-wave (FMCW) electronic transceiver setup for thickness measurements of multilayer structures. Model-based signal processing techniques are used to resolve layers below the inherent resolution limit.
2：Sample Selection and Data Sources:
The study uses a well-known sample-under-test (SUT) and an industrial plastic tube as samples. Calibration samples are measured separately to determine the refractive index of each layer.
3：List of Experimental Equipment and Materials:
A W band transceiver operating from around 70 to 110 GHz is used. The setup includes a GP-GPU for signal processing.
4：Experimental Procedures and Operational Workflow:
The SUT is radiated with a linear frequency-modulated wave. The difference frequency portions between the emitted signal and reflections are processed to determine layer thicknesses.
5：Data Analysis Methods:
Signal models are compared with the measurement signal using a GP-GPU. The model with the highest correlation coefficient indicates the accurate thickness of the sample.
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