研究目的
To determine the absolute emission intensities of X-ray lines below 100 keV using a high-resolution spectrometer with an accurate ef?ciency calibration.
研究成果
Combining MC simulations with a measurement of L-X-ray and gamma emission intensities of Am-241, we successfully calibrated the FEP ef?ciency of a 4-pixel MMC photon spectrometer after adapting the relevant dimensions in the simulated geometry to the actual geometry. The simulated FEP ef?ciency interpolates the experimental FEP ef?ciency data points.
研究不足
The dimensions of the setup were not known with suf?cient precision, requiring optimization of the simulated geometry using the measured ef?ciencies as a reference.
1：Experimental Design and Method Selection:
The FEP ef?ciency calibration of a MMC detector was performed by combining measurements of a standard source with Monte Carlo simulations using the code PENELOPE-
2：Sample Selection and Data Sources:
20 A standard source of Am-241 was used, with well-known emission intensities.
3：List of Experimental Equipment and Materials:
The MMC detector SMX3, a dilution refrigerator, a collimator, and a beryllium window were used.
4：Experimental Procedures and Operational Workflow:
The source was placed at 15 mm from SMX3 with a collimator of
5：8 mm diameter. The detector was cooled down to 9 mK in a dilution refrigerator. The output voltage from the SQUID electronics was ampli?ed, band-pass-?ltered, and digitized. Data Analysis Methods:
The spectrum was treated using the peak-?tting program COLEGRAM to extract the number of counts per FEP.
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