研究目的
Investigating the enhancement of solar conversion efficiency through the use of novel layer-by-layer PbS:Hg and CdS quantum dots-sensitized ZnO thin films prepared by sol–gel spin coating.
研究成果
The study successfully demonstrated that the layer-by-layer deposition of PbS:Hg and CdS QDs on Ag:ZnO thin films significantly enhances solar conversion efficiency. The novel approach of combining these QDs with Ag:ZnO thin films prepared by sol–gel spin coating offers a promising pathway for improving the performance of quantum dot-sensitized solar cells.
研究不足
The study is limited by the SILAR method's time-consuming nature and the potential for agglomeration and cracks in the QD layer due to low-temperature deposition.
1:Experimental Design and Method Selection:
ZnO thin films were prepared by sol–gel spin coating using zinc acetate as a precursor. PbS:Hg and CdS quantum dots were synthesized and deposited layer-by-layer over ZnO and Ag:ZnO thin films using the SILAR method.
2:Sample Selection and Data Sources:
Fluorine-doped tin oxide (FTO) substrates were used as the base for thin film deposition. All chemicals were used without further purification.
3:List of Experimental Equipment and Materials:
Spin coater, MProbe Thin Film Measurement System, X-ray diffraction (XRD), scanning electron microscopy (SEM), UV–Vis spectroscopy, solar simulator, and Keithley 2400 Source Meter were used.
4:Experimental Procedures and Operational Workflow:
The process involved substrate pretreatment, sol–gel spin coating for ZnO and Ag:ZnO thin films, SILAR method for QDs deposition, and characterization of the films.
5:Data Analysis Methods:
Optical properties were analyzed using UV–Vis spectroscopy, structural properties by XRD, and morphology by SEM. Photovoltaic properties were measured under AM 1.5G illumination.
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X-ray diffraction
Mini Flex
Rigaku
Used for investigating the structural characterization and crystalline properties of the films.
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Source Meter
2400
Keithley
Used for measuring the photovoltaic properties of the solar cells.
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Spin coater
Used for depositing uniform thin films on substrates by spin coating.
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MProbe Thin Film Measurement System
Mprobe UV–Vis–SR Spectrometer
Semiconsoft
Used for measuring the thickness of thin films.
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Scanning electron microscopy
JSM 5610LV, S-3400N
JEOL, HITACHI
Used for examining the surface morphology of the films.
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UV–Vis spectroscopy
DR 5000
HACH
Used for exploring optical characteristics of the thin films.
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Solar simulator
Newport
Used for providing AM 1.5G illumination for photovoltaic properties measurement.
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