研究目的
Investigating the dc current in amorphous As2Te3(In) thin films to identify different conduction regimes and understand the electric field dependence of dc conductivity.
研究成果
The study concluded that the dc current in As2Te3(In) thin films exhibits three distinct conduction regimes, identified through Detrended Fluctuation Analysis. These regimes are characterized by different scaling exponents, indicating an interplay between multiple conduction mechanisms. The positive maximal Lyapunov exponents close to zero indicate weak or low-dimensional chaos, explaining the non-repeatability of the time series.
研究不足
The study is limited by the non-repeatability of the time series under the same voltage values due to sensitive dependence on initial conditions and the continuous temporal evolution of the transport properties.
1：Experimental Design and Method Selection:
The study involved measuring the time evolutions of transient current data for As2Te3(In) thin films at different electric fields and analyzing the data using time series analysis to identify different conduction regimes.
2：Sample Selection and Data Sources:
The samples were As2Te3(In) thin films set up as sandwiched metal-glass-metal structures.
3：List of Experimental Equipment and Materials:
The films were manufactured by vacuum evaporation using an Edwards Coating System, E306A. The IeV characteristics were measured by a programmable picoammeter/voltage source (Keithley, model 4200-SCS).
4：6A. The IeV characteristics were measured by a programmable picoammeter/voltage source (Keithley, model 4200-SCS). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The dc current time series was measured for the dc voltages of
5：001 V, 002 V, 005 V, 01 V, 1 V, 5 V and 1 V at room temperature. Data Analysis Methods:
The maximal Lyapunov exponents were calculated, and Detrended Fluctuation Analysis was utilized to characterize the behavior of dc current time series.
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