研究目的
Investigating the effect of the valence state of Mo dopants (Mo3+ and Mo5+) on the photocatalytic performance of TiO2 thin films.
研究成果
The photocatalytic performance of TiO2 thin films is significantly influenced by the valence state of Mo dopants, with Mo3+ and Mo5+ doping leading to different trends in crystallinity, surface area, and band gap. The defect structure, particularly the presence of Mo(5-x)+ and Ti(4+x)+, plays a dominant role in determining photocatalytic efficiency. The study highlights the importance of dopant valence in tailoring the properties of TiO2 for photocatalytic applications.
研究不足
The study is limited to low annealing temperatures (450°C), which may not represent equilibrium conditions. The sensitivity of characterization techniques may not detect all defect states or minor phases.
1:Experimental Design and Method Selection:
Sol-gel TiO2 thin films with varying Mo3+ or Mo5+ doping levels were spin coated on fused silica substrates and annealed at 450°C for 2 h.
2:Sample Selection and Data Sources:
Fused silica substrates were used to minimize contamination.
3:List of Experimental Equipment and Materials:
Titanium tetraisopropoxide (TTIP), isopropanol, MoCl3, MoCl5, fused silica substrates, spin coater, muffle furnace.
4:Experimental Procedures and Operational Workflow:
Precursor solutions were prepared, spin-coated onto substrates, dried, and annealed.
5:Data Analysis Methods:
GAXRD, Raman, AFM, UV-Vis, XPS were used for characterization; photocatalytic performance was assessed by methylene blue degradation.
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AFM
Dimension Icon
Bruker
Surface topography and grain size analysis
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UV-Vis Spectrophotometer
Lambda 35
PerkinElmer
Optical transmission spectra
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Titanium tetraisopropoxide
TTIP
Sigma-Aldrich
Precursor for TiO2 thin films
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GAXRD
Empyrean Thin-Film XRD
PANalytical
Mineralogical characterization
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XPS
ESCALAB 250Xi
Thermo Scientific
Surface composition analysis
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Isopropanol
Sigma-Aldrich
Solvent for precursor solution
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MoCl3
Sigma-Aldrich
Mo3+ dopant precursor
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MoCl5
Sigma-Aldrich
Mo5+ dopant precursor
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Spin Coater
WS-65052
Laurell Technologies
Deposition of thin films
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Muffle Furnace
Annealing of thin films
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Raman Microscope
inVia
Renishaw
Mineralogical characterization
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