研究目的
To investigate the potential of ZnO/SiC layered structure for high frequency surface acoustic wave (SAW) devices application.
研究成果
ZnO/SiC layered structure is promising for the high frequency SAW device development and applications, demonstrating large K2 and high Q over 5–7 GHz range and achieving a 6.8 GHz SAW filter.
研究不足
The insertion loss values of the SAW filters are not perfect for current commercial application, indicating areas for optimization in device design and crystal quality of ZnO films.
1:Experimental Design and Method Selection:
Highly (0002) oriented ZnO piezoelectric films were deposited on high acoustic velocity SiC substrates. Surface acoustic wave (SAW) devices were fabricated and their performance was analyzed.
2:Sample Selection and Data Sources:
ZnO films with various thicknesses were deposited on 4 inch commercial high-resistance 6H-SiC(0001) wafers.
3:List of Experimental Equipment and Materials:
Magnetron sputtering system for ZnO film deposition, conventional photolithography and lift-off processes for device fabrication, Cascade probe station and Aglient E5071C vector network analyzer for measurements.
4:Experimental Procedures and Operational Workflow:
Fabrication of one-port SAW resonators with various wavelengths, measurement of S-parameters.
5:Data Analysis Methods:
Analysis of phase velocities Vp, electromechanical coupling coefficients K2, and quality factors Q using MBVD equivalent circuit and theoretical calculations.
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