研究目的
To develop a new fluorescent nanomaterial for effectively testing Cr(VI) in aqueous phase by overcoming the weaknesses of complicated material synthesis process, high preparation cost and low fluorescent efficiency.
研究成果
The thin g-C3N4 nanosheets modified by secondary calcination and HNO3 treatment exhibit high sensitivity, low LOD, and good selectivity for detecting Cr(VI) in aqueous solutions. The method provides a feasible route for the synthesis of g-C3N4-based nanomaterials for effective detection of Cr(VI).
研究不足
The study focuses on the detection of Cr(VI) in aqueous solutions and may not be directly applicable to other types of samples or environments. The sensitivity and selectivity of the method may be affected by the presence of other ions or substances.
1：Experimental Design and Method Selection:
The g-C3N4 nanosheets were modified by secondary calcination and HNO3 treatment to improve their fluorescence testing capability for Cr(VI).
2：Sample Selection and Data Sources:
The initial g-C3N4 nanosheets were prepared by heating urea and then treated with HNO
3：The thin g-C3N4 nanosheets were obtained by secondary calcination and HNO3 treatment. List of Experimental Equipment and Materials:
A Bruker D8 Advance diffractometer for XRD, a 5100 Agilent for AFM, a Shimadzu UV2550 spectrophotometer for UV–vis absorption spectra, a Bruker Equinox 55 Spectrometer for FT-IR spectra, a PerkinElmer LS 55 Luminescence Spectrometer for fluorescence spectra, and a Horiba Jobin Yvon Fluorolog-3 spectrometer for fluorescence lifetimes.
4：Experimental Procedures and Operational Workflow:
The g-C3N4 nanosheets were characterized by various techniques, and their fluorescence testing capability for Cr(VI) was evaluated under different conditions.
5：Data Analysis Methods:
The fluorescence intensity was analyzed using the Stern-Volmer equation and the double logarithmic plot method.
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5100 Agilent
5100
Agilent
Atomic force microscopy (AFM)
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Shimadzu UV2550 spectrophotometer
UV2550
Shimadzu
UV–vis absorption spectra and UV–vis diffuse reflectance spectra (UV–vis DRS) measurement
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Bruker Equinox 55 Spectrometer
Equinox 55
Bruker
Fourier transform infrared (FT-IR) spectra measurement
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PerkinElmer LS 55 Luminescence Spectrometer
LS 55
PerkinElmer
Fluorescence spectra collection
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Anton Paar SurPASS automatic analyzer
SurPASS
Anton Paar
Zeta potential testing
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Bruker D8 Advance diffractometer
D8 Advance
Bruker
X-ray powder diffraction (XRD) patterns measurement
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Horiba Jobin Yvon Fluorolog-3 spectrometer
Fluorolog-3
Horiba Jobin Yvon
Fluorescence lifetimes determination
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