研究目的
Investigating the enhanced piezoelectric properties of Sr(1.7)(Na0.5Bi0.5)0.3Bi4Ti5O18 ceramics through compositional variation and structural analysis.
研究成果
The study demonstrated that Sr(2-x)(Na0.5Bi0.5)xBi4Ti5O18 ceramics exhibit enhanced piezoelectric and ferroelectric properties, particularly at x = 0.3, due to structural modifications and dopant effects. The findings suggest potential applications in piezoelectric devices requiring high Curie temperatures.
研究不足
The study is limited by the compositional range (0 ≤ x ≤ 0.5) and the focus on structural and piezoelectric properties without extensive exploration of other potential dopants or higher doping levels.
1：Experimental Design and Method Selection:
The study employed sol-gel synthesis for fine powder preparation, followed by ceramic fabrication. Structural and property analyses were conducted using XRD, TEM, Raman spectroscopy, SEM, and dielectric measurements.
2：Sample Selection and Data Sources:
Ceramics with varying compositions (x = 0, 0.1, 0.25, 0.3, 0.4, 0.5) were prepared and analyzed.
3：1, 25, 3, 4, 5) were prepared and analyzed. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Instruments included PANalytical XpertPro for XRD, Tecnai-T20 TEM, FEI InspectF50 SEM, WiTec Alpha 300 Raman spectrometer, Agilent 4294A Impedance Analyzer, and Radiant Technologies Precision Premier II Tester for ferroelectric measurements.
4：Experimental Procedures and Operational Workflow:
Powders were synthesized via sol-gel, calcined, compacted into pellets, sintered, and characterized for structural and electrical properties.
5：Data Analysis Methods:
Data were analyzed using Rietveld refinement for XRD, Lorentzian fits for Raman spectra, and standard equations for dielectric and piezoelectric properties.
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X-ray powder diffraction
PANalytical XpertPro
PANalytical
Structural analysis of ceramics
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Transmission electron microscope
Tecnai-T20
FEI
Microscopic structural analysis
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Scanning electron microscope
FEI InspectF50
FEI
Micro-structural analyses
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Raman spectrometer
WiTec Alpha 300
WiTec
Raman spectral analysis
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Impedance Analyzer
Agilent 4294A
Agilent
Dielectric property measurement
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PE loop tracer
Radiant Technologies Precision Premier II Tester
Radiant Technologies
Ferroelectric property measurement
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Piezo meter
KCF technologies PM-3500
KCF technologies
Piezoelectric coefficient measurement
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