研究目的
To introduce an optical frequency comb (OFC) to scan-less confocal laser microscopy (CLM) to provide optical-phase-based image contrast, enabling the visualization of transparent non-fluorescent objects or reflective objects with nanometer unevenness.
研究成果
The study successfully introduced a new image contrast based on the optical phase to scan-less CLM using OFC with DCS, enabling nanometer surface topography with high precision. Potential applications include surface topography of semiconductor objects and non-staining 3D imaging of living cells and tissues.
研究不足
The depth resolution is limited by the use of a low-NA objective lens. The image acquisition rate is limited by the measurement rate of DCS and the number of signal accumulations.
1：Experimental Design and Method Selection:
The study combines OFC with dual-comb spectroscopy (DCS) to achieve scan-less confocal phase imaging.
2：Sample Selection and Data Sources:
A commercialized 1951 USAF resolution test chart with a negative pattern was used as a sample.
3：List of Experimental Equipment and Materials:
Includes femtosecond Er-fiber OFC lasers, optical bandpass filters, diffraction grating, objective lens, and a balanced detector among others.
4：Experimental Procedures and Operational Workflow:
The signal OFC light was diffracted, focused onto the sample, reflected, and then analyzed using DCS to decode confocal amplitude and phase images.
5：Data Analysis Methods:
Mode-resolved amplitude and phase spectra were obtained by Fourier transform of the acquired interferogram.
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