研究目的
To verify the consistency of latent track radii measured by direct and indirect methods in bulk swift heavy ion irradiated YIG single crystals and to determine whether, in the case of YIG, sample thickness has an effect on the observed track size.
研究成果
The radii of amorphous tracks in bulk YIG are consistent with previously reported results from indirect techniques for electronic stopping power values exceeding ～13 keV/nm. For electronic stopping powers less than ～13 keV/nm, an underestimation of amorphous tracks size by indirect methods is observed when compared to direct methods. The sample thickness has an insignificant influence on the size of amorphous tracks in YIG.
研究不足
The study covers only a small range of ion species, energies, and electronic stopping powers, providing only preliminary results. Further irradiation experiments are planned to perform comparisons in a broader range of these parameters.
1：Experimental Design and Method Selection:
Bulk YIG single crystals were irradiated with swift Kr and Xe ions at various energies and electronic stopping powers. Transmission electron microscopy (TEM) was used for direct observation of latent tracks.
2：Sample Selection and Data Sources:
YIG single crystalline samples with surface orientation near the ?1 1 1? plane were used.
3：List of Experimental Equipment and Materials:
FEI Helios Nanolab 650 for FIB lamellae preparation, JEOL ARM200F transmission electron microscope for TEM analysis.
4：Experimental Procedures and Operational Workflow:
Samples were irradiated at room temperature to fluences in the range of 1010–1011 ion/cm
5：Plan view lamellae were cut from a region (0 ± 5) μm below the irradiated surface for TEM analysis. Data Analysis Methods:
HAADF STEM was employed for imaging, and the diameter of amorphous tracks was determined from the intensity change in the HAADF STEM signal profile.
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