研究目的
To propose a new selective absorption and multiplication avalanche photodiode (SAM-APD) platform composed of vertical InGaAs-GaAs nanowire arrays for single photon detection at near-infrared (NIR) wavelengths, aiming to reduce dark count rate (DCR) and afterpulsing probability compared to conventional InGaAs-based SPADs.
研究成果
The nanowire-based InGaAs-GaAs SAM-APD platform demonstrates significantly reduced dark count rate and afterpulsing probability, enabling operation in free-running mode with high photon count rates. This approach provides a foundation for highly efficient single photon detection at NIR wavelengths, with potential for further optimization in absorption efficiency and operating temperature.
研究不足
The study is limited by the low photon detection efficiency (PDE) due to non-optimized plasmonic grating antenna and the maximum operating temperature of 150 K for the nanowire SAM-APDs. Surface leakage current at higher temperatures also poses a challenge.
1:Experimental Design and Method Selection:
The study involves the design and fabrication of nanowire SAM-APDs with InGaAs absorption layers and GaAs avalanche layers. The methodology includes selective-area epitaxy for nanowire growth and standard photolithography for device fabrication.
2:Sample Selection and Data Sources:
The samples are n+-GaAs (111)B wafers patterned with nanowire arrays. Data is collected from electrical and optical measurements under various temperatures and illumination conditions.
3:List of Experimental Equipment and Materials:
Equipment includes a metal-organic chemical vapor deposition (MOCVD) system for nanowire growth, scanning electron microscopy (SEM) for structural characterization, and a cryogenic chamber for low-temperature measurements. Materials include InGaAs and GaAs for the nanowires.
4:Experimental Procedures and Operational Workflow:
The workflow involves nanowire growth, device fabrication, and characterization of electrical and optical properties, including dark count rate, photon count rate, and timing jitter measurements.
5:Data Analysis Methods:
Data analysis includes statistical analysis of dark and photon counts, estimation of afterpulsing probability, and calculation of timing jitter.
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