研究目的
To develop a facile method for producing high-quality and high-yield graphene by direct micro?uidization in water/surfactant systems.
研究成果
The micro?uidization method successfully produced high-concentration few-layer graphene dispersions with relatively high quality within a few hours, facilitating mass production and promoting wider applications of graphene.
研究不足
The study focuses on the exfoliation of graphite in aqueous systems with surfactants, which may limit the applicability to other solvents or systems. The scalability of the method for industrial production was not fully explored.
1:Experimental Design and Method Selection:
The study employed micro?uidization to exfoliate graphite in water/surfactant systems, investigating the effects of surfactant type, chamber pressure, and micro?uidization cycles.
2:Sample Selection and Data Sources:
Pristine graphite was used as the feed material, with three surfactants (SDS, Tween 80, and Pluronic F127) chosen for stabilization.
3:List of Experimental Equipment and Materials:
A lab-scale pressure homogenized micro?uidizer (M-110L, Micro?uidics, USA) was used for exfoliation.
4:Experimental Procedures and Operational Workflow:
Graphite suspensions were processed through the micro?uidizer at various pressures and cycles, followed by centrifugation to remove unexfoliated sheets.
5:Data Analysis Methods:
The graphene dispersions were characterized by UV-visible spectroscopy, SEM, TEM, AFM, Raman spectroscopy, and XPS to determine concentration, quality, and layer numbers.
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UV-visible spectrophotometer
Cary 60
Agilent
Used to determine the concentration of graphene dispersions by measuring absorbance.
Cary 60 UV-Vis Spectrophotometer
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SEM
Hitachi S4800
Hitachi
Used to characterize the morphology of graphene flakes and graphite powder.
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TEM
Hitachi H-800
Hitachi
Used to characterize the morphology of exfoliated graphite.
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HRTEM
JEOL 2100F
JEOL
Used to analyze the number of layers of graphene.
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XPS
K-alpha
ThermoFisher
Used for X-ray photoelectron spectroscopy with an Al Kα radiation source.
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Micro?uidizer
M-110L
Micro?uidics
Used for the exfoliation of graphite in water/surfactant systems to produce few-layer graphene.
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X-ray diffractometer
D8 DISCOVER
German
Used to obtain XRD patterns of graphite powder and FLG-based film samples.
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AFM
CSPM55OO
China
Used to measure the height of graphene sheets in tapping mode.
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Raman Spectromicroscope
XploRA PLUS
Japan
Used to investigate the quality of graphene product with a 532-nm activation laser.
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