研究目的
To demonstrate a 75-channel silicon nitride based interleaved AWG spectrometer with 1 nm resolution over 75 nm bandwidth centered at 1550 nm and compare its performance with a conventional AWG spectrometer.
研究成果
The interleaved Si3N4 AWG spectrometer demonstrated lower adjacent crosstalk values, better channel uniformity, and a smaller device size compared to a conventional AWG with the same resolution and bandwidth. This makes it appealing for applications requiring high resolution and large bandwidth, such as imaging, spectroscopy, and astronomy.
研究不足
Fabrication-related phase errors led to a 5-dB difference between simulated and measured crosstalk values. The interleaved AWG showed higher crosstalk in central waveguides due to uncoupled stray light. A center wavelength shift of 3.3 nm was observed, possibly due to insufficient etching of rib waveguides.
1：Experimental Design and Method Selection:
The design includes a primary AWG with 3 channels and 1 nm resolution, and three secondary AWGs each with 25 channels and 3 nm resolution. The interleaved AWG design is compared with a conventional AWG design.
2：Sample Selection and Data Sources:
Silicon nitride (Si3N4) waveguides on an 8-μm-thick thermally-oxidized silicon wafer were used.
3：List of Experimental Equipment and Materials:
Supercontinuum light source (NKT SuperK EXTREME, EXR4), optical spectrum analyzer (Yokogawa, AQ6370B), single-mode polarization-maintaining (PM) fiber.
4：Experimental Procedures and Operational Workflow:
TE-polarized light was coupled into the input waveguide, and the output signal was sent to an optical spectrum analyzer. Output waveguides were measured by moving the fiber successively along output channels.
5：Data Analysis Methods:
Transmission spectra were normalized with respect to a curved reference waveguide. Performance metrics included crosstalk, excess loss, and channel uniformity.
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