1：Experimental Design and Method Selection:

The study employed the melt-quenching technique for fabricating glass samples, followed by controlled crystallization to obtain glass ceramics (GC). X-ray diffractometer (XRD) and scanning electron microscope (SEM) were used for phase identification and surface morphology evaluation, respectively. Impedance and immittance spectroscopy were utilized to study the electrical behavior.

2：Sample Selection and Data Sources:

Glass ceramic samples with compositions x = 0.0, 0.1, 0.3, 0.5, and 0.7 were prepared. XRD and SEM data were collected for structural analysis, and electrical properties were measured using an LCR meter.

3：0, 1, 3, 5, and 7 were prepared. XRD and SEM data were collected for structural analysis, and electrical properties were measured using an LCR meter. List of Experimental Equipment and Materials:

3. List of Experimental Equipment and Materials: X-ray diffractometer (Rigaku Ultima IV), scanning electron microscope (JSM-7610F), HIOKI-LCR TESTER 3532-50, and various reagent grade chemicals including PbO, CaO, TiO2, SiO2, H3BO3, and Ge.

4：Experimental Procedures and Operational Workflow:

Glass samples were melted at 1400 °C, quenched, and annealed. XRD and SEM analyses were performed on the GC samples. Electrical measurements were conducted at varying frequencies and temperatures.

5：Data Analysis Methods:

XRD data were analyzed using Match 3 software and the Rietveld refinement program 'Fullprof'. Impedance spectra were fitted with an equivalent circuit model using EIS Spectrum analyzer software.