研究目的
To design, fabricate, and test a detector head for an energy-dispersive X-ray spectroscopy (EDS) system for a scanning transmission electron microscope (STEM) that meets the energy resolution and counting rate requirements.
研究成果
The detector head met the energy resolution and counting rate requirements for STEM-EDS systems, demonstrating the effectiveness of the superconducting flip-chip bonding technology in reducing the number of wire bondings.
研究不足
The yield of the flip-chip bonding was not perfect, and the method requires careful handling to avoid stress at the bumps due to different linear thermal expansion coefficients.
1:Experimental Design and Method Selection:
The detector head was designed with a 64-pixel TES X-ray microcalorimeter and 64 SQUID array amplifiers (SAAs) mounted on a copper rod cooled to about 100 mK. Flip-chip bonding was used to reduce the number of wire bondings.
2:Sample Selection and Data Sources:
The performance was tested using Al K emission from an Al film mounted in the STEM.
3:List of Experimental Equipment and Materials:
A copper rod, TES microcalorimeter, SAAs, sapphire circuit board, and superconducting flip-chip bonding technology were used.
4:Experimental Procedures and Operational Workflow:
The detector head was assembled, installed in the STEM-EDS system, and its performance was tested by measuring the energy resolution and counting rate.
5:Data Analysis Methods:
The energy resolution was measured from an X-ray spectrum, and the relationship between the counting rate and the energy resolution was analyzed.
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