研究目的
Discussing organometallic precursors with respect to their synthesis, chemical and physical properties and their applications in the epitaxial growth of III–V compound semiconductors.
研究成果
Although the huge variety of organometallic compounds partly reflects the variability of organic compounds in general and the imaginativeness of modern chemists, only a few compounds have been found useful for widespread applications in modern epitaxial growth of III–V compound semiconductors. In particular the need for adequately high vapor pressures favor the smallest molecules containing only few hydro-carbon groups bound to the central metal. The need for extremely high purity organometallic precursors has challenged chemists to develop novel synthesis routes and purification techniques.
研究不足
The article does not explicitly mention the limitations of the research or the experiments conducted.
1:Experimental Design and Method Selection:
The article discusses the use of organometallic precursors in metal organic vapor phase epitaxy (MOVPE) and chemical beam epitaxy (CBE) for the deposition of III–V compound semiconductors.
2:Sample Selection and Data Sources:
The precursors discussed include a wide variety of volatile organometallic compounds used as matrix element precursors or as dopant sources in III–V MOVPE or CBE.
3:List of Experimental Equipment and Materials:
The physical properties of the most commonly used MOVPE precursors are provided, including their melting points, boiling points, and vapor pressures.
4:Experimental Procedures and Operational Workflow:
The synthesis and purification techniques for these precursors are detailed, along with their applications in the epitaxial growth of III–V compound semiconductors.
5:Data Analysis Methods:
The electrical and optical properties of the III–V semiconductor layer are critically dependent on the metallic and organic purity of the organometallic source, with various analytical techniques used for the detection of impurities.
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