研究目的
Investigating the effects of annealing temperature on the structural, optical, electrical and hydrophilic properties of FTO/TiO2 tandem films prepared by aerosol-assisted chemical vapor deposition.
研究成果
The FTO/TiO2 tandem films prepared by AACVD and annealed at 500°C exhibited excellent emissivity and water contact angle, making them suitable for energy-saving coated glass applications. The enhancement of hydrophilicity was attributed to the emerging heterojunction at the FTO/TiO2 interface.
研究不足
The study focused on the effects of annealing temperature on FTO/TiO2 tandem films' properties. The investigation was limited to the range of 400°C to 600°C annealing temperatures. The study did not explore the effects of other deposition parameters or the long-term stability of the films.
1：Experimental Design and Method Selection:
The study used aerosol-assisted chemical vapor deposition (AACVD) with nano-TiO2 suspension as precursors to prepare TiO2 thin films on FTO substrates. The effects of annealing temperature on the films' properties were investigated.
2：Sample Selection and Data Sources:
FTO substrates and commercial nano-TiO2 particle suspensions were used. The films were annealed at 400°C, 500°C, and 600°C.
3：List of Experimental Equipment and Materials:
AACVD equipment, ultrasonic atomization generator, mu?e furnace, X-ray diffractometer (XRD), high-resolution transmission electron microscope (HRTEM), scanning electron microscope (SEM), Fourier transform infrared spectroscopy (FTIR), spectroscopic ellipsometry (SE), contact angle meter, Eddy current device, X-ray photoelectron spectroscopy (XPS).
4：Experimental Procedures and Operational Workflow:
Films were deposited under air conditions, annealed at various temperatures, and characterized for structural, optical, electrical, and hydrophilic properties.
5：Data Analysis Methods:
XRD for phase analysis, HRTEM for structure features, SEM for surface morphology, FTIR for emittance and optical parameters, contact angle meter for hydrophilic properties, Eddy current device for sheet resistance, XPS for phase characterization.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
X-ray diffractometer
Rigaku D/max 2550pe
Rigaku
Phase analysis of the FTO/TiO2 tandem films
-
High-resolution transmission electron microscope
FEI Tecnai F20
FEI
Observation of the structure features of nano-TiO2
-
Scanning electron microscope
Hitachi S-4800
Hitachi
Observation of the surface morphology of the tandem films
-
Fourier transform infrared spectroscopy
Bruker Tensor27
Bruker
Investigation of the emittance and optical parameter of the samples
-
Spectroscopic ellipsometry
GES-5E
Semilab
Measurement of optical parameters
-
Eddy current device
GES-5E
Semilab
Measurement of surface sheet resistances
-
Contact angle meter
Dataphysics OCA20
Dataphysics
Evaluation of hydrophilic properties
-
X-ray photoelectron spectroscopy
Krato, Axis Supra
Krato
Characterization of the existence of the TiO2 phase
-
登录查看剩余6件设备及参数对照表
查看全部
