研究目的
Investigating the current-driven magnetization switching in ferromagnetic bulk Rashba semiconductor (Ge,Mn)Te thin films.
研究成果
The study successfully observed current-driven magnetization switching in bulk Rashba ferromagnet (Ge,Mn)Te thin films, demonstrating the Rashba-Edelstein effect of bulk origin. The efficiency of magnetization switching and anomalous Hall conductivity strongly depend on the Fermi-level position, reflecting the unique band structure of the ferromagnetic Rashba system.
研究不足
The limited magnetization reversal may be due to insufficient current density to avoid heating-induced damage in the thin film. The sample temperature may increase at high current density regions, leading to an intermediate magnetic state with randomly distributed domains.
1:Experimental Design and Method Selection:
The study involves the growth of (Ge,Mn)Te thin films on InP (111) substrates by molecular beam epitaxy (MBE) and the fabrication of Hall bar devices for transport measurements.
2:Sample Selection and Data Sources:
The samples are (Ge,Mn)Te thin films with varying thicknesses and hole densities, characterized by x-ray diffraction and transport measurements.
3:List of Experimental Equipment and Materials:
MBE for thin-film growth, physical properties measurement system (PPMS) for transport measurements, and photolithography for device fabrication.
4:Experimental Procedures and Operational Workflow:
The procedure includes thin-film growth, device fabrication, initialization of magnetization, pulse current injection under a small in-plane magnetic field, and measurement of anomalous Hall resistance.
5:Data Analysis Methods:
Analysis of Hall resistivity and anomalous Hall conductivity to study the Rashba-Edelstein effect and its dependence on Fermi-level position.
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