摘要： The design cycle until now only guaranteed the electrical performance of integrated circuits (ICs) before aging. Performances throughout product lifetimes are, in general, assured by taking design margins and accelerated aging tests that come in a second complementary phase to guarantee the circuit reliability. In case of degradation, a reactive design correction will necessarily mean a delay in placing the product on the market. The design cycle subject to delay has not yet passed control. This study proposes guaranteeing the level of reliability of an integrated circuit during the design phase. This new design methodology requires a simulation tool for the aging of components. In this phase of the study, reliability tests on manufactured circuits will consolidate the results of reliability simulation up to the point of refining these individualized models by component. Once the components of a technology are properly modeled, the number of reliability incidents must tend towards 0. Marketing is advanced and the design cycle is gaining control. This makes it possible to hope that this technology will be available on the market as soon as the first silicon is available, without having to wait for any accelerated qualification tests. The circuits are guaranteed to be conceptually reliable.