研究目的

Assessing the applicability of the Monte Carlo method for modeling images obtained in a scanning electron microscope and identifying its limitations.

研究成果

The Monte Carlo method is fundamentally unsuitable for modeling SEM images due to its inability to accurately simulate all relevant electron-matter interactions, insufficient random-number generation, and impractical computational times. The study suggests that without significant advancements in computational methods and a deeper understanding of electron interaction mechanisms, the Monte Carlo method cannot be reliably used in scanning electron microscopy.

研究不足

The Monte Carlo method cannot account for all electron-matter interaction mechanisms affecting SEM image formation. Current random-number generators are insufficient for modeling electron scattering, and the computational time required is prohibitively long. There's also a lack of evidence supporting the method's accuracy in image generation.