研究目的
To synthesize and characterize a novel visible-light-driven Z-scheme AgI/Bi2WO6 heterojunction photocatalyst with enhanced photocatalytic activity for the degradation of tetracycline (TC) under visible light irradiation.
研究成果
The AgI/Bi2WO6 heterojunction, particularly with 20 wt% AgI, demonstrated superior photocatalytic activity for TC degradation under visible light, attributed to high specific surface area, enhanced light absorption, and efficient charge separation via a Z-scheme mechanism involving Ag nanoparticles. The catalyst showed good stability over four cycles, with significant roles of ?O2-, h+, and ?OH radicals in the degradation process. This work provides insights for designing Z-scheme photocatalysts for environmental remediation.
研究不足
The study is limited to laboratory-scale experiments with specific conditions; scalability and real-world application feasibility are not addressed. The photocatalytic performance may vary with different pollutants or environmental factors. The stability after multiple cycles showed a slight decrease, indicating potential long-term degradation issues.
1:Experimental Design and Method Selection:
The study involved synthesizing Bi2WO6 microspheres via a hydrothermal method and AgI/Bi2WO6 heterojunctions via an in situ precipitation method to enhance photocatalytic activity under visible light. The rationale was to create a Z-scheme system for efficient charge separation.
2:Sample Selection and Data Sources:
Samples included pure Bi2WO6, pure AgI, and AgI/Bi2WO6 heterojunctions with varying AgI weight percentages (5%, 10%, 20%, 40%). Tetracycline (TC) was used as the model pollutant.
3:List of Experimental Equipment and Materials:
Materials included bismuth nitrate pentahydrate, sodium tungstate dihydrate, potassium iodide, silver nitrate, isopropyl alcohol, EDTA-2Na, benzoquinone, and TC from Chinese medicine group chemical reagent co., Ltd. Equipment included XRD (Bruker), SEM (S4800), TEM and HRTEM (Tecnai G20), XPS, BET analyzer (Micromeritics ASAP 2460), UV-vis spectrometer (Shimadzu UV-2600), TOC analyzer (Shimazu TOC-VCPH), spectrofluorimeter (F-4500), PL spectrophotometer (Perkin Elmer LS 55), electrochemical workstation (CHI760E), ESR spectrometer (Bruker ER200-SRC), and a 300 W Xe lamp (CEL-HXF300) with a 420 nm cutoff filter.
4:Experimental Procedures and Operational Workflow:
Synthesis involved hydrothermal treatment at 160°C for 20 h for Bi2WO6, followed by in situ precipitation for AgI/Bi2WO
5:Photocatalytic tests involved dispersing catalyst in TC solution, achieving adsorption-desorption equilibrium in dark for 30 min, irradiating with visible light, sampling at intervals, and analyzing TC concentration via UV-vis spectroscopy. Data Analysis Methods:
Data were analyzed using pseudo-first-order kinetics for degradation rates, TOC for mineralization, 3D EEMs for degradation properties, PL and photocurrent for charge transfer, and ESR for radical detection.
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UV-vis spectrometer
UV-2600
Shimadzu
Measure UV-vis diffuse reflectance spectra
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TOC analyzer
TOC-VCPH
Shimazu
Analyze the mineralization ability of samples
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Photoluminescence spectrophotometer
LS 55
Perkin Elmer
Perform PL spectra under excitation wavelength of 320 nm
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Electron spin resonance spectrometer
Bruker ER200-SRC
Bruker
Verify ESR measurements under λ > 420 nm
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X-ray diffraction
Bruker
Measure the phase composition of the catalysts
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Scanning electron microscopy
S4800
Examine the morphology of the samples
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Transmission electron microscopy
Tecnai G20
Investigate the microstructures of the samples
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High-resolution transmission electron microscopy
Tecnai G20
Investigate the microstructures with high resolution
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X-ray photoelectron spectroscopy
Measure the valence state and surface elements of the samples
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Brunauer-Emmett-Teller analyzer
Micromeritics ASAP 2460
Micromeritics
Measure specific surface area based on N2 adsorption
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Spectrofluorimeter
F-4500
Provide three-dimensional excitation-emission matrix fluorescence spectra
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Electrochemical workstation
CHI760E
Examine photocurrent responses in a three-electrode system
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Xe lamp
CEL-HXF300
Serve as the visible light source with a 420 nm cutoff filter
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