研究目的
Investigating the effects of WO3 facet choice on the photoelectrochemical performance of WO3/BiVO4 heterojunction photoanodes.
研究成果
The research demonstrates that the facet orientation of WO3 significantly influences the PEC performance of WO3/BiVO4 heterojunctions. WO3 with a high (002) facet ratio leads to a lower work function, higher quasi-Fermi level, and preferential exposure of the (020) facet in BiVO4, resulting in more negative onset potentials, higher photocurrents at low potentials, and improved hole injection efficiency. This facet control is a valid strategy for enhancing charge extraction and water oxidation efficiency in heterojunction photoanodes, with implications for sustainable hydrogen production.
研究不足
The study is limited to WO3/BiVO4 heterojunctions and may not generalize to other materials. The synthesis methods might be complex and not easily scalable. The PEC performance could be influenced by factors like film thickness and interface quality, which were not fully optimized. Potential areas for optimization include improving the uniformity of BiVO4 coating and exploring other facet combinations.
1:Experimental Design and Method Selection:
The study involved synthesizing WO3 films with different crystal facet ratios using hydrothermal and solvothermal methods, followed by loading BiVO4 via spin coating or drop casting to form heterojunctions. The rationale was to explore how facet orientation affects electronic structure and PEC performance. Theoretical models included XRD for crystallographic analysis, UPS and XPS for electronic structure, and PEC measurements for performance evaluation.
2:Sample Selection and Data Sources:
WO3 films were fabricated on FTO substrates with variations in precursor solutions to achieve different facet ratios (e.g., thinflake-WO3, plate-WO3, 200-WO3, 002-WO3). BiVO4 was loaded onto these films. Data sources included synthesized samples characterized by various spectroscopic and microscopic techniques.
3:3). BiVO4 was loaded onto these films. Data sources included synthesized samples characterized by various spectroscopic and microscopic techniques. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Chemicals included tungstic acid, sodium tungstate dihydrate, poly(vinyl alcohol), bismuth(III) nitrate pentahydrate, vanadyl acetylacetonate, hydrogen peroxide, oxalic acid, urea, acetonitrile, acetic acid, hydrochloric acid, and deionized water. Equipment included autoclaves for hydrothermal synthesis, spin coaters, furnaces for annealing, XRD instruments (Rigaku Ultima IV, X'PERT PRO), SEM (Quanta 650 FEG), TEM (JEOL 2010 F, EM-002B), UV-vis spectrometer (Cary 5000), XPS (Kratos Axis Ultra), electrochemical workstation (CHI660D), solar simulator (Newport 9600), and oxygen sensor (Fox, Ocean Optics).
4:Experimental Procedures and Operational Workflow:
WO3 films were synthesized via solvothermal or hydrothermal methods with specific precursor compositions and conditions (e.g., temperature, time). BiVO4 was coated by spin coating or drop casting with multiple layers and annealing. Characterization involved XRD, SEM, TEM, XPS, UPS, UV-vis, and PEC measurements in a three-electrode system with Pt counter and Ag/AgCl reference electrodes under AM 1.5 G illumination.
5:5 G illumination. Data Analysis Methods:
5. Data Analysis Methods: Data analysis included calculating intensity ratios from XRD, work function from UPS, band alignments from XPS, photocurrent densities from linear sweep voltammetry, IPCE and APCE from spectral measurements, and faradaic efficiency from oxygen evolution measurements. Statistical techniques were not explicitly mentioned, but software like X'pert texture was used for pole figures.
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X-ray diffractometer
Rigaku Ultima IV
Rigaku
Acquiring glancing-angle X-ray diffraction patterns to analyze crystalline structures.
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Transmission electron microscope
JEOL 2010 F
JEOL
Studying microstructure and obtaining selected area electron diffraction patterns.
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X-ray photoelectron spectrometer
Kratos Axis Ultra
Kratos
Determining elemental composition and measuring valence band XPS.
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Oxygen sensor
Fox
Ocean Optics
Measuring evolved oxygen during PEC water splitting.
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X-ray diffractometer
X'PERT PRO
PHILIPS
Measuring pole figures for texture analysis.
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Scanning electron microscope
Quanta 650 FEG
Studying morphology and microstructure of samples.
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Transmission electron microscope
EM-002B
TOPCON
Measuring TEM and SAED patterns for samples with high drop casting volume.
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UV-vis-NIR spectrometer
Cary 5000
Recording UV-vis absorption spectra in the range of 400-600 nm.
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Electrochemical workstation
CHI660D
Performing photoelectrochemical measurements in a three-electrode system.
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Solar simulator
Newport 9600
Newport
Providing illumination source with AM 1.5 G filter for PEC tests.
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