研究目的
To fabricate and study polar surface dominated Sn doped ZnO nanowires with an octagonal cross-section, investigate their structural properties, chemical bonding states, and the influence of Sn dopant on photoluminescence properties.
研究成果
Sn-doped ZnO nanowires with polar surface dominated octagonal cross-sections were successfully fabricated, showing reduced oxygen vacancy concentration and deep level emission due to Sn doping. The strain from doping and planar defects promotes polar surface configuration, enhancing potential applications in optoelectronics.
研究不足
The study is limited to Sn doping in ZnO nanowires; other dopants or conditions were not explored. The experimental setup may have constraints in pressure and temperature control, and the characterization techniques might have resolution limits affecting defect analysis.
1：Experimental Design and Method Selection:
Chemical vapor deposition method was used to grow bare and Sn-doped ZnO nanowires on SiO2/Si substrates with a gold catalyst. The method was chosen to control morphology and doping.
2：Sample Selection and Data Sources:
Samples were prepared using ZnO powder, graphite, and Sn powders as source materials. Substrates were SiO2/Si coated with a 5-nm-thick gold film.
3：List of Experimental Equipment and Materials:
Equipment includes a horizontal quartz tube chamber, mechanical pump, XRD (X’Pert PRO MRD, PANalytical), FE-SEM (JSM-6500F, JEOL), TEM (JEM-2100F), XPS (AXIS NOVA, Kratos Inc.), Raman microscope (Horiba Jobin Yvon LabRAM HR800), and PL spectrometer (SPEX 1403). Materials include ZnO powder, graphite, Sn powders, SiO2/Si substrates, gold thin-film, epoxy, and Cu tubes for TEM sample preparation.
4：3). Materials include ZnO powder, graphite, Sn powders, SiO2/Si substrates, gold thin-film, epoxy, and Cu tubes for TEM sample preparation.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Mixed powders were placed in the chamber, heated to 950°C under Ar + 5% oxygen flow at 100 sccm and 3–5 Torr pressure. Samples were characterized using XRD, SEM, TEM, XPS, Raman, and PL measurements at room temperature.
5：Data Analysis Methods:
XRD patterns were indexed to wurtzite phase, XPS data were calibrated and analyzed for elemental concentrations and bonding states using sensitivity factors, Raman spectra were used to evaluate defect concentrations, and PL spectra were analyzed for emission peaks.
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