研究目的
To obtain ordered arrays of platinum and palladium nanowires on a silicon surface using an improved templating method.
研究成果
Ordered arrays of platinum and palladium nanowires were successfully formed on a modified silicon surface using a scalable liquid-phase templating method. The systems are attractive for applications like nanowire networks in transparent conductive layers, despite larger dimensions for platinum compared to catalytic standards.
研究不足
The geometric dimensions of the platinum nanowires are larger than world records for catalysis applications, and the method may have temperature sensitivity with difficulties below 26°C and above 30°C due to solution changes and micelle bubble formation.
1：Experimental Design and Method Selection:
A bottom-up templating method in the aqueous phase was used, involving surface modification with APTMS and CTAB micellar templates for directed metal deposition.
2：Sample Selection and Data Sources:
Silicon substrates were used, modified with APTMS. Reagents were purchased from Sigma-Aldrich.
3：List of Experimental Equipment and Materials:
Atomic force microscope MultiMode V, RTESP cantilevers (Veeco), fluid cell (MMTMEC model, Veeco), Peltier device, Digi-Sense Thermocouple Thermometer, SEM-EDS (Carl Zeiss EVO LS 10), contact angle goniometer (DSA30, KRüSS), chemicals including CTAB, H2PtCl6·6H2O, PdCl2, hydrazine-hydrate, H2SO4, H2O2, APTMS (Gelest, Inc., 97%), methanol.
4：Experimental Procedures and Operational Workflow:
Silicon surface was oxidized with H2SO4/H2O2 mixture, then modified with APTMS. A drop of CTAB and metal precursor solution was applied, held for 30 min, reduced with hydrazine-hydrate, cleaned, and dried. AFM and SEM-EDS were used for characterization.
5：Data Analysis Methods:
AFM image analysis for morphology, SEM-EDS for elemental composition, contact angle measurements for surface properties, and statistical analysis of morphological parameters.
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Atomic Force Microscope
MultiMode V
Veeco
Reveal the morphology of metal systems through imaging.
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Cantilever
RTESP
Veeco
Used with AFM for scanning samples with silicone tips.
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Fluid Cell
MMTMEC
Veeco
Hold surfactant solutions for imaging at solid/liquid interface in AFM.
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SEM-EDS
EVO LS 10
Carl Zeiss
Investigate elemental composition of samples with EDS detector.
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Peltier Device
Vary liquid temperature in fluid cell experiments.
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Thermocouple Thermometer
Digi-Sense
Measure temperature in experiments.
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Contact Angle Goniometer
DSA30
KRüSS
Determine static wetting contact angle by sessile drop method.
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Antivibrational System
SG0508
Eliminate external distortions in AFM measurements.
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