研究目的
To fabricate stable carbon nanotube cold cathode electron emitters with enhanced and stable electron emission properties through post-growth electrical aging, aiming to improve crystallinity, homogenize structure, and achieve long-term stability for vacuum nanoelectronic applications.
研究成果
Electrical aging using Joule heating effectively enhances the crystallinity and structural uniformity of CNT emitters, leading to improved electron emission current (from 3 mA to 6 mA) and stable operation for 9 hours at 97 mA/cm2. This post-treatment is a simple and effective method for achieving high-performance cold cathode emitters, with optimal aging conditions set just before visible Joule heating to prevent damage.
研究不足
Excessive Joule heating during electrical aging can damage CNT emitters, limiting the maximum applicable bias. The process requires precise control of aging conditions to avoid damage, and the uniformity of CNT growth remains challenging, potentially affecting reproducibility.
1:Experimental Design and Method Selection:
The study involved fabricating CNT field emitters using direct current plasma-enhanced chemical vapor deposition (dc-PECVD) and applying electrical aging as a post-treatment to enhance electron emission properties. The aging process utilized Joule heating for structural modification.
2:Sample Selection and Data Sources:
CNT emitters were grown on a SiO2 layer with an n-type silicon substrate, patterned into islands with specific dimensions (3 μm diameter, 15 μm spacing, 225 emitters per island, 128 islands total).
3:List of Experimental Equipment and Materials:
Equipment included a radio frequency magnetron sputter for Ni deposition, dc-PECVD system for CNT growth, vacuum chamber for aging, diode system for I-V measurements, DC power supply, multimeter, Raman spectrometer, scanning electron microscope (SEM), and digital single lens reflex camera. Materials included acetylene and ammonia gases, argon gas, and silicon substrates.
4:Experimental Procedures and Operational Workflow:
Steps included substrate preparation, Ni deposition, photolithography for patterning, CNT growth at 630°C with specific gas flows, annealing at 1000°C, electrical aging in vacuum with bias set at Joule heating onset, and characterization using SEM, Raman spectroscopy, and I-V measurements.
5:Data Analysis Methods:
Data were analyzed using SEM for morphology, Raman spectroscopy for crystallinity (ID/IG ratio), and I-V curves for emission properties, with statistical analysis of current stability.
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