研究目的
Investigating the sensitivity of a charge sharing cancellation algorithm to analog parameters spread in hybrid pixel detectors for X-ray detection, and evaluating its performance through simulations and experiments.
研究成果
The C8P1 algorithm significantly improves registration uniformity in hybrid pixel detectors by mitigating charge sharing effects, but its performance is sensitive to analog parameters spread. Correction techniques are essential for optimal operation, and dynamic modeling reveals additional time-related deterioration mechanisms. The study confirms the algorithm's effectiveness and highlights the need for precise parameter control.
研究不足
The static model does not account for timing properties of analog blocks, and the dynamic model, while more accurate, may still have simplifications. Experimental results show some unaccounted registration errors at pixel borders, indicating potential limitations in model completeness or other factors like noise and parameter spread.
1:Experimental Design and Method Selection:
The study involves simulations using static and dynamic models of the C8P1 algorithm to investigate charge sharing effects, and experimental pencil beam measurements with synchrotron radiation. The static model is implemented in LabVIEW for fast simulations, while the dynamic model uses Cadence for timing-related aspects.
2:Sample Selection and Data Sources:
A hybrid pixel detector with a Chase Jr. chip bonded to a silicon 320-μm-thick detector is used. Data is collected from simulations with defined parameters (e.g., pixel size, photon energy) and experiments at the Advanced Photon Source.
3:List of Experimental Equipment and Materials:
Chase Jr. chip, silicon detector, synchrotron radiation source (Advanced Photon Source), simulation software (LabVIEW, Cadence).
4:Experimental Procedures and Operational Workflow:
For simulations, input parameters are set (e.g., pixel matrix size, photon energy), and photon impact positions are varied. For experiments, the detector is scanned with a pencil beam at 5 μm steps, and counts are registered. Correction techniques for gain and offset are applied.
5:Data Analysis Methods:
Analysis includes calculating a quality parameter Q to evaluate registration uniformity, comparing simulated and experimental results, and using statistical methods to assess performance.
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