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Probing the origin of lateral heterogeneities in synthetic monolayer molybdenum disulfide

DOI:10.1088/2053-1583/aafd9a 期刊:2D Materials 出版年份:2019 更新时间:2025-09-23 15:23:52
摘要: Synthetic two-dimensional (2D) materials provide an opportunity to realize large-scale applications in next generation electronic and optoelectronic devices. One of the biggest challenges of synthetic 2D materials is the lateral heterogeneity such as non-uniform strain, composition and defect density. The electronic and optical properties are found to be not uniform in many cases, even within a single crystalline domain, potentially limiting synthetic 2D materials in advanced devices. In this work, we probe the origin of the widely observed lateral heterogeneities in synthetic monolayer MoS2. Epitaxial single crystalline domains (~10 μm) are optically homogeneous and uniform with 0.3~0.4% tensile strain, while misoriented domains (>20 μm) exhibit distinct photoluminescence (PL) emissions from the center to the edge, along with released strain at the center. Temperature-dependent Raman and PL mapping reveals that the center of non-epitaxial domains exhibits an enhanced PL due to increased defect density. Combining experiment and DFT, we hypothesize that two growth mechanisms, solid-solid and vapor-solid growth, may be responsible for the lateral heterogeneities. Density function theory (DFT) calculations suggest that oxygen defects can readily lead the loss of epitaxy, consistent with our observation of a MoOx core-shell structure that only exists in misoriented domains.
作者: Kehao Zhang,Yuanxi Wang,Jaydeep Joshi,Fu Zhang,Shruti Subramanian,Mauricio Terrones,Patrick Vora,Vincent Crespi,Joshua A. Robinson
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To probe the origin of lateral heterogeneities in synthetic monolayer molybdenum disulfide (MoS2), including non-uniform strain, composition, and defect density, and to understand the growth mechanisms and role of oxygen defects in these heterogeneities.

The research concludes that lateral heterogeneities in synthetic monolayer MoS2 arise from oxygen-rich defects and two distinct growth mechanisms: solid-solid growth for large misoriented domains (L-MoS2) leading to higher defect density and released strain at centers, and vapor-solid growth for small epitaxial domains (S-MoS2) resulting in uniform properties. DFT calculations support that oxygen defects cause loss of epitaxy. This understanding is crucial for improving synthetic 2D material quality for advanced optoelectronic applications, suggesting controlled growth conditions to minimize defects.

The study is limited to MoS2 on sapphire substrates; findings may not generalize to other 2D materials or substrates. HRTEM could not distinguish between oxygen and sulfur atoms due to similar atomic numbers, limiting defect type identification. The synthesis method (powder vaporization) may introduce uncontrolled variables affecting heterogeneity.

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