研究目的
To employ atomic sensors for high-resolution near-field imaging and far-field antenna measurements, demonstrating capabilities in RF electric field sensing and metrology.
研究成果
The study successfully demonstrates high-resolution near-field imaging of a horn antenna with atomic sensors at λ/10 spatial resolution and a dynamic field range of 72 to 240 V/m, showing good agreement with calculations. Far-field antenna pattern measurements with a fiber-coupled probe also align well with traditional methods, validating the atomic sensor approach for RF electric field metrology and imaging applications.
研究不足
Potential limitations include RF backscatter from nearby objects, standing-wave effects within the dielectric sensing element, and deviations due to differences in measurement environments (e.g., lack of RF absorber in laboratory settings). The sensitivity and accuracy may be affected by the choice of Rydberg state and experimental conditions.
1：Experimental Design and Method Selection:
The experiment uses atomic sensors based on quantum-optical spectroscopy of Rydberg states in rubidium vapor cells. Electromagnetically induced transparency (EIT) spectroscopy is employed to detect RF-induced AC-Stark shifts and Autler-Townes splittings of Rydberg states for electric field measurements.
2：Sample Selection and Data Sources:
A glass cell filled with rubidium vapor is used as the sensing element. Near-field measurements are performed on a Ku-band horn antenna emitting
3：4884 GHz fields, and far-field measurements on a WR-90 standard gain horn at 6 GHz. List of Experimental Equipment and Materials:
Equipment includes lasers at 780 nm and 480 nm wavelengths, a rubidium vapor cell, a Ku-band horn antenna, a Narda 640 standard gain horn antenna, translation stages for positioning, and a fiber-coupled atomic-sensor probe.
4：Experimental Procedures and Operational Workflow:
For near-field imaging, the horn antenna is translated in steps across the sensing plane, and EIT spectroscopy is conducted to measure field distributions. For far-field measurements, the antenna is scanned in angle, and the probe measures field patterns using Autler-Townes splittings.
5：Data Analysis Methods:
Electric field strength is calculated from measured peak shifts using the relation E = (4Δ/α)^0.5, where Δ is the shift and α is the atomic polarizability. Data is compared with calculated distributions and traditional measurements for validation.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容
