研究目的
To analyze uncertainties in ac–dc difference measurements using an AC Josephson voltage standard (ACJVS) and compare them with conventional methods, focusing on improving measurement accuracy in voltage metrology.
研究成果
The ACJVS can reduce uncertainties in ac–dc difference measurements by factors of 2–10 compared to conventional methods for audio frequencies and low voltages. Type A uncertainties are dominated by the TTS, while Type B uncertainties are primarily due to transmission line effects above 10 kHz. Future improvements could focus on better transmission line characterization and reducing on-chip inductance.
研究不足
The analysis is limited to audio frequencies and voltages up to 200 mV; uncertainties increase significantly above 10 kHz due to transmission line effects. Corrections for systematic errors require precise characterization, which may not be feasible in all setups. The study does not address errors from electromagnetic interference or connection repeatability in the overall uncertainty budget.
1：Experimental Design and Method Selection:
The study uses an ACJVS for ac–dc difference measurements, employing delta-sigma modulation for waveform synthesis and Monte Carlo simulations for uncertainty analysis.
2：Sample Selection and Data Sources:
Measurements are performed on a Fluke 792A thermal transfer standard (TTS) across frequencies from 100 Hz to 100 kHz and voltages from 2 mV to 200 mV.
3：List of Experimental Equipment and Materials:
Includes ACJVS devices with Josephson junction arrays, pulse pattern generators, digitizers, compensation bias amplifiers, DC blocks, and transmission lines.
4：Experimental Procedures and Operational Workflow:
Involves configuring the ACJVS for single or dual-array operation, performing ac–dc transfers using the deflection method, and analyzing output responses with digital voltmeters.
5：Data Analysis Methods:
Uses pooled sample standard deviation for Type A uncertainties, Monte Carlo simulations for Type B uncertainties, and root-sum-square combination for overall uncertainty.
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