研究目的
To investigate the effect of transition metal ion (Ni2+) doping at the B-site of SrZrO3 on the structural and optical properties of the perovskite oxide.
研究成果
SrZr1-xNixO3 perovskites are monophasic with orthorhombic structure. Ni2+ substitution increases structural ordering and crystallite size, while the optical band gap remains around 5 eV. PL intensity decreases due to quenching effects from Ni2+ doping, indicating its role as a luminescence killer in these materials.
研究不足
The study is limited to Ni2+ substitution concentrations up to x=0.20; higher concentrations or other dopants are not explored. The synthesis method may introduce porosity and agglomeration, affecting material properties. Optical measurements are at room temperature only, not covering temperature-dependent effects.
1:Experimental Design and Method Selection:
The study uses the solid-state reaction method for synthesis, with characterization via XRD, SEM-EDS, UV-Vis, and PL spectroscopy to analyze structural, morphological, and optical properties. Rietveld refinement is employed for structural confirmation.
2:Sample Selection and Data Sources:
Polycrystalline samples of SrZr1-xNixO3 (x = 0.00, 0.05, 0.10, 0.15, 0.20) are prepared using stoichiometric amounts of SrCO3, ZrO2, and NiO (99.9% purity).
3:00, 05, 10, 15, 20) are prepared using stoichiometric amounts of SrCO3, ZrO2, and NiO (9% purity).
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Agate mortar and pestle for mixing, hydraulic press for pelletizing, high resistance furnace for heat treatment, XRD (PANalytical X'Pert Pro system), SEM (Model: JSM-6510/6460LV, JEOL), Auto fine coater (Model: JEC-3000FC) for platinum sputtering, UV-Vis spectrophotometer (Model: Hitachi, 3900H), PL spectrophotometer (Model: Agilent Carry Eclipse, G9800A) with xenon flash lamp.
4:Experimental Procedures and Operational Workflow:
Powders are mixed with acetone, calcined at 800°C for 10h, pressed into pellets, sintered at 1300°C for 15h (doped samples) or 1500°C for 5h (undoped sample), with regrinding and resintering for doped samples. XRD is performed with Cu-Kα radiation, SEM on fractured surfaces, EDS for elemental analysis, UV-Vis for diffuse reflectance, and PL for emission and excitation spectra.
5:Data Analysis Methods:
Crystallite size calculated using Scherrer's formula, Rietveld refinement with Fullprof software, grain size from SEM using intercept method, band gap from Kubelka-Munk function, and Urbach energy analysis.
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