研究目的
To fabricate and investigate Tb3+-doped transparent oxyfluoride glass-ceramics containing YF3 nanocrystals for enhanced luminescent properties and potential application as X-ray scintillating materials.
研究成果
The fabricated Tb3+-doped oxyfluoride glass-ceramics with YF3 nanocrystals show significantly enhanced luminescence and prolonged lifetimes due to Tb3+ incorporation into low-phonon-energy nanocrystals, indicating potential as X-ray scintillators for slow event detection.
研究不足
The study is limited to specific compositions and thermal-treatment conditions; scalability and practical application in real-world X-ray detection systems may require further optimization and testing.
1：Experimental Design and Method Selection:
The study used a traditional melt-quenching route with thermal-treatment to fabricate glass-ceramics, employing XRD, TEM, PL, XEL, and decay curve measurements for characterization.
2：Sample Selection and Data Sources:
Samples were prepared with a nominal composition of 39SiO2–21Al2O3–24LiF–16YF3~
3：25Tb4O7 using high-purity raw materials. List of Experimental Equipment and Materials:
Equipment includes a comprehensive thermal analyzer (STA449 F3), X-ray diffraction device (Bruker D8 Advance), spectrometer (Perkin-Elmer Lambda 35), TEM (JEOL 2010), photoluminescence spectrometer (Hitachi F-4500), X-ray excited spectrometer, and nanosecond flash lamp. Materials include SiO2, Al2O3, LiF, YF3, Tb4O7 (all ≥
4：7% purity), corundum crucible, brass mold, and muffle furnace. Experimental Procedures and Operational Workflow:
Raw materials were mixed, melted at 1450°C for 40 minutes, poured into a brass mold, annealed at 400°C for 2 hours, and thermal-treated at 530°C and 540°C for 2 hours to form glass-ceramics. Samples were cut and polished to 3 mm thickness. Characterization involved TG-DSC, XRD, transmission spectra, TEM, PL, XEL, and decay curves.
5：Data Analysis Methods:
Data were analyzed using Scherer's equation for crystal size estimation, and lifetime was calculated using the average lifetime formula.
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X-ray diffraction device
D8 Advance
Bruker
To ascertain the crystal structure of samples.
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spectrometer
Lambda 35
Perkin-Elmer
To identify optical transmission spectra.
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transmission electron microscopy
2010
JEOL
To record micrographs of samples.
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photoluminescence spectrometer
F-4500
Hitachi
To perform photoluminescence spectroscopy.
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comprehensive thermal analyzer
STA449 F3
To determine the heat treatment temperature under an N2 atmosphere.
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X-ray Excited Spectrometer
For measurement of XEL spectra.
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nanosecond flash lamp
To collect decay curves as the excitation source.
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