研究目的
To reduce the luminance of the black state in PS-VA LCDs by lowering stress-induced retardation at the edge of pixel electrodes without changing materials, and to investigate the optical birefringence caused by stress differences in heterogeneous layers like a-IZO and a-SiNx.
研究成果
The research demonstrates that microscopic-stress-induced retardation (MSIR) at the edges of patterned electrodes in heterogeneous amorphous layers causes light leakage in black states of PS-VA LCDs. By minimizing stress differences between layers through optimized deposition processes, retardation can be reduced, leading to up to a 10% increase in contrast ratio without altering other materials.
研究不足
The study is limited to specific amorphous materials (a-IZO and a-SiNx) and PS-VA LCD mode; it may not generalize to other materials or display technologies. Optimization of stress conditions requires precise control, and the simulation model assumes idealized conditions that might not fully capture real-world complexities.
1：Experimental Design and Method Selection:
The study involved fabricating LCD panels with PS-VA mode, measuring stress and retardation, and performing 3D simulations to analyze stress-induced effects. Theoretical models included stress-optic equations and numerical simulations using FlexPDE.
2：Sample Selection and Data Sources:
Samples were LCD panels with micro-slit patterns using a-IZO and a-SiNx layers deposited under various conditions. Data came from stress measurements, retardation imaging, and luminance measurements.
3：List of Experimental Equipment and Materials:
Equipment included thin film stress measurement system FSM 500TC, image polarimeter AXO-STEP 20H, Imaging Photometer and Colorimeter PM-1400 camera, and materials such as a-SiNx, a-IZO, a-ITO, liquid crystals from Merck, polyimide JSR Al-60702, and glass substrates.
4：Experimental Procedures and Operational Workflow:
Procedures involved depositing a-SiNx and a-IZO thin films under controlled conditions, patterning electrodes, assembling LCD cells with liquid crystal injection and UV curing, measuring stress, retardation, and luminance, and conducting simulations with FlexPDE.
5：Data Analysis Methods:
Data were analyzed using statistical methods for stress and retardation correlations, and simulations were used to model stress distributions and predict retardation effects.
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