摘要： Influence of the capping layer material on the interfacial Dzyaloshinskii-Moriya interaction in Pt/Co/capping layer structures probed by Brillouin light scattering. Co ultrathin films, of various thicknesses (0.8 nm ≤ tCo ≤ 2.5 nm), have been grown by sputtering on Si substrates, using Pt buffer layers and different capping layers (Cu, Ir, MgO and Pt). The x-ray diffraction revealed that our films have a (111) out-of-plane texture with various degrees of strains. Their magnetic properties have been studied by vibrating sample magnetometry (VSM) and Brillouin light scattering (BLS) in the Damon-Eshbach geometry. VSM characterizations revealed that films with Co thickness below (above) the spin reorientation transition thickness, which is capping layer dependent, are perpendicularly (in-plane) magnetized, suggesting the existence of an interface anisotropy. The magnetic dead layer has been taken into account to precisely determine the surface anisotropy constant was found to be 1.42 ± 0.02 erg/cm2 and of 1.33 ± 0.02 erg/cm2 for the Pt/Co/Cu and Pt/Co/Ir samples, respectively, suggesting that it is due to the Pt/Co interface and that the top Co/Cu or Co/Ir interfaces have a negligible contribution. A lower value of 1.07 ± 0.02 erg/cm2 has been obtained for Pt/Co/MgO most probably due to over-oxidation of Co at the Co/MgO interface. The BLS measurements revealed a pronounced nonreciprocal spin waves propagation, due to the interfacial Dzyaloshinskii-Moriya interaction (iDMI) induced by Pt interface with Co, which increases with decreasing Co thickness. The surface iDMI constant Ds estimated at -0.8 pJ/m, -1.05 pJ/m and –0.95 pJ/m, respectively for Pt/Co/Ir, Pt/Co/Cu and Pt/Co/MgO for the samples where a linear thickness dependence of the effective iDMI constant has been observed.