研究目的
To produce few-layer graphene via a green synthesis method using Opuntia ficus-indica extract as a reducing and exfoliating agent, avoiding harmful chemicals and reducing energy consumption.
研究成果
The green synthesis method using Opuntia ficus-indica extract and sonication successfully produces few-layer graphene with low defect density and minimal oxidation, offering an environmentally friendly alternative to traditional methods. This approach is viable for applications in thermal transport, mechanical properties improvement, charge carriers, and solar cells.
研究不足
The method may not fully exfoliate all graphite layers, as incomplete partition was observed, and the use of more extract did not improve results. The process is limited to room temperature and short sonication time, which might affect scalability or efficiency.
1:Experimental Design and Method Selection:
The study uses a green synthesis approach to exfoliate graphite into few-layer graphene using Opuntia ficus-indica extract and sonication, aiming to replace harmful chemicals and reduce energy use.
2:Sample Selection and Data Sources:
Commercial graphite (99.99% purity; Sigma Aldrich) and Opuntia ficus-indica extract were used.
3:99% purity; Sigma Aldrich) and Opuntia ficus-indica extract were used. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment includes an ultrasonic bath, glass beaker, deionized water, glass substrate, Horiba Jobin–Yvon LabRAM HR Raman spectrometer with helium-neon laser (
4:8 nm, 25 mW), Bruker D8 Advance diffractometer with Cu Kα line (λ = 5405 ?), PerkinElmer Phi 04-300 XPS device (Mg Kα, 3 × 10^-9 kPa), XE-Bios Park Systems AFM microscope with Si cantilever (PPP-NCHR3 M), and JEOL JEM2010F TEM. Materials include graphite, Ofi extract, deionized water, ethanol, and argon for etching. Experimental Procedures and Operational Workflow:
6 Ofi extract was prepared, mixed with graphite and water, sonicated for 30 min, supernatant transferred to a glass substrate and dried. Samples were characterized using Raman spectroscopy, XRD, XPS, AFM, and TEM.
5:Data Analysis Methods:
Raman spectra were deconvoluted to analyze G and 2D bands, XRD profiles were examined for peak intensity, XPS for C:O ratio, AFM for roughness and thickness, TEM for structural analysis, and FFT for interplanar distances.
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Raman Spectrometer
LabRAM HR
Horiba Jobin–Yvon
Characterize the crystal structure of the samples using Raman spectroscopy.
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X-ray Diffractometer
D8 Advance
Bruker
Obtain diffraction patterns from graphitic powder using Cu Kα line.
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XPS Device
Phi 04-300
PerkinElmer
Perform XPS measurements calibrated using the C 1s band, with argon etching.
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TEM
JEM2010F
JEOL
Analyze structural and morphological properties of the samples.
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AFM Microscope
XE-Bios
Park Systems
Characterize surface roughness in noncontact mode.
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Ultrasonic Bath
Sonicate the mixture of graphite, Ofi extract, and water for exfoliation.
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Graphite
Sigma Aldrich
Starting material for graphene synthesis.
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