研究目的
To develop a method for C-doping into h-BN at lower annealing temperatures using alkaline earth metal compounds to achieve photocatalytic activity under visible light for water splitting and CO2 reduction.
研究成果
C-doping into h-BN was successfully achieved at 1000°C using alkaline earth metal compounds, resulting in BCN nanosheets with tunable band gaps and photocatalytic activity for water splitting and CO2 reduction under visible light, providing a foundation for future development of BN-based photocatalysts.
研究不足
The method requires specific alkaline earth metal compounds and may have limitations in scalability or reproducibility; photocatalytic stability could be improved, and further optimization of carbon doping levels is needed to avoid phase separation.
1：Experimental Design and Method Selection:
A facile synthesis method involving thermal annealing with alkaline earth metal compounds to promote C-doping into h-BN at 1000°C, based on the formation of BCN nanosheets in a borate melt phase.
2：Sample Selection and Data Sources:
Precursors include boric acid, urea, glucose, and alkaline earth metal nitrates (Mg, Ca, Sr, Ba), mixed in aqueous solution, dried, ground, and annealed under N2 flow.
3：List of Experimental Equipment and Materials:
Horizontal tubular furnace, agate mortar, ultrasonic bath, various chemicals from suppliers like Alfa Aesar and Sinopharm.
4：Experimental Procedures and Operational Workflow:
Mix precursors, dry at 70°C and 200°C, grind, anneal at 1000°C for 4 hours under N2, treat with HNO3, wash, exfoliate ultrasonically, and dry.
5：Data Analysis Methods:
Characterization using XRD, FT-IR, SEM, TEM, XPS, Raman spectroscopy, UV-Vis, BET, AFM, and photoelectrochemical analysis.
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PANalytical X'Pert-pro MPD X-ray power diffractometer
X'Pert-pro MPD
PANalytical
Record powder X-ray diffraction patterns for structural analysis.
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Spectrum One FT-IR spectrometer
Spectrum One
PerkinElmer
Record Fourier transform infrared spectra for chemical bond analysis.
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Hitachi S4800 scanning electron microscope
S4800
Hitachi
Perform scanning electron microscopy for morphological analysis.
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FEI Tecnai G2 F20 S-TWIN transmission electron microscope
Tecnai G2 F20 S-TWIN
FEI
Conduct transmission electron microscopy and high-resolution imaging.
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JEM-ARM 200F scanning transmission electron microscope
JEM-ARM 200F
JEOL
Perform HAADF-STEM imaging and EDS elemental mapping.
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ESCALAB 20 Xi XPS system
ESCALAB 20 Xi
Thermo Fisher Scientific
Acquire X-ray photoelectron spectroscopy spectra for elemental analysis.
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U-3900H Spectrophotometer
U-3900H
Hitachi
Record UV-Vis diffuse reflectance spectra.
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Veeco Dimension 3100 SPM system
Dimension 3100
Veeco
Implement atomic force microscopy for thickness measurement.
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Electrochemical Workstation CHI660E
CHI660E
CH Instruments
Conduct photoelectrochemical analysis.
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Renishaw in Via plus Raman spectrometer
in Via plus
Renishaw
Perform Raman spectroscopic measurements.
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ASAP 2420-4 BET analyzer
ASAP 2420-4
Micromeritics
Measure specific surface area using Brunauer–Emmett–Teller method.
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Ag/AgCl reference electrode
3 M KCl
Serve as reference electrode in electrochemical measurements.
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Pt plate counter electrode
Serve as counter electrode in electrochemical measurements.
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