研究目的
To synthesize and investigate the luminescence properties of Bi-doped La2O3 powder phosphor, optimizing doping concentration and annealing temperature for blue emission.
研究成果
La2-xO3:Bix was successfully synthesized with hexagonal phase, showing blue emission at 462 nm under 308 nm excitation attributed to Bi3+ transitions. Optimal doping is x=0.002 with annealing at 1200°C in air. Concentration quenching and decreased lifetime indicate strong Bi3+ interactions. The material is suitable for blue-emitting phosphor applications.
研究不足
The study is limited to powder phosphors synthesized by sol-gel combustion; potential issues include moisture absorption leading to hydroxide formation, and the origin of surface steps in doped samples is unclear. Detection limits for Bi in EDS and Auger spectroscopy may affect composition analysis.
1:Experimental Design and Method Selection:
The sol-gel combustion method was used for synthesis, with citric acid as fuel, and annealing in air or reducing atmosphere to study luminescence properties.
2:Sample Selection and Data Sources:
Samples with Bi concentrations x=
3:001 to 01 were prepared using lanthanum nitrate, bismuth nitrate, and citric acid, dissolved in deionized water. List of Experimental Equipment and Materials:
Materials included La(NO3)3·6H2O (
4:999%, Sigma Aldrich), Bi(NO3)3·5H2O (999%, Sigma Aldrich), C6H8O7·H2O (5%, Sigma Aldrich), deionized water, nitric acid. Equipment included furnace, Bruker D8 Advance diffractometer, Lambda 950 UV-vis spectrophotometer, Cary Eclipse fluorescence spectrophotometer, JSM-7800F SEM, X-MaxN80 EDS detector, PHI 700 Nano Auger microprobe, FLS980 fluorescence spectrometer. Experimental Procedures and Operational Workflow:
Solutions were heated at 80°C for 3h, then combusted at 250°C, annealed at 800-1400°C for 2h, and stored in vacuum desiccator. XRD, SEM, EDS, reflectance, PL, and decay measurements were performed.
5:Data Analysis Methods:
XRD data analyzed with Scherrer equation, reflectance with Kubelka-Munk function and Tauc plot, PL spectra measured, decay curves fitted with double exponential model, CIE coordinates calculated using GoCIE software.
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Bruker D8 Advance diffractometer
D8 Advance
Bruker
X-ray diffraction analysis to confirm crystal structure
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Lambda 950 UV-vis spectrophotometer
Lambda 950
PerkinElmer
Diffuse reflectance spectroscopy to study absorption properties
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Cary Eclipse fluorescence spectrophotometer
Cary Eclipse
Agilent
Photoluminescence measurements with excitation source
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JSM-7800F scanning electron microscope
JSM-7800F
JEOL
Analysis of particle morphology
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X-MaxN80 detector
X-MaxN80
Oxford Instruments
Energy dispersive X-ray spectroscopy for chemical composition
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FLS980 fluorescence spectrometer
FLS980
Edinburgh Instruments
Measurement of decay curves
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PHI 700 Nano scanning Auger electron microprobe
PHI 700 Nano
Physical Electronics
Surface elemental composition analysis
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GoCIE software
GoCIE V2
Calculation of CIE coordinates for emitted light
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