研究目的
To investigate the structural and electronic origin of high performance in bis-lactam based organic thin film transistors by developing a novel molecule with 2D intermolecular interactions and comparing it with a 1D analog.
研究成果
C8-NTDT exhibits superior charge transport properties due to its 2D intermolecular interactions, leading to high hole mobility in both vacuum and solution-processed devices, demonstrating the importance of 2D electronic coupling for organic semiconductors.
研究不足
The study focuses on specific bis-lactam molecules; generalizability to other organic semiconductors may be limited. Device performance could be affected by environmental factors like air exposure.
1:Experimental Design and Method Selection:
The study involved theoretical calculations (DFT, Marcus theory) and experimental methods (synthesis, characterization, device fabrication) to correlate intermolecular interactions with charge transport properties.
2:Sample Selection and Data Sources:
C8-NTDT and C8-DPPT molecules were synthesized and purified; single crystal structures were used for analysis.
3:List of Experimental Equipment and Materials:
Instruments included DSC, XRD, AFM, OM, 2D-GIXD, and OFET fabrication equipment; materials included organic semiconductors and substrates.
4:Experimental Procedures and Operational Workflow:
Thin films were deposited via vacuum deposition and spin-coating at various temperatures; devices were characterized electrically.
5:Data Analysis Methods:
Data were analyzed using software like Gaussian09, ADF, and CrystalExplorer for theoretical calculations, and Keithley 4200 for electrical measurements.
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Differential Scanning Calorimeter
DSC 7
Perkin-Elmer
Used for thermal analysis to determine melting temperatures of materials.
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X-ray Diffractometer
D8-advance
Bruker Miller Co.
Used for out-of-plane XRD measurements to analyze thin film crystallinity.
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Atomic Force Microscope
Nanoscope Ⅲ multimode SPM
Bruker
Used for AFM imaging to study thin film morphology and roughness.
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Semiconductor Parameter Analyzer
4200
Keithley
Used for electrical characterization of OFET devices.
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Optical Microscope
DMLP
Leica Microsystems Wetzlar GmbH
Used for optical microscopy to observe thin film morphology.
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Quartz Crystal Microbalance
Used to monitor thin film thickness during vacuum deposition.
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Spin Coater
Used for solution processing of thin films via spin-coating.
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Shadow Mask
Used for patterning gold electrodes in device fabrication.
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